Zobrazeno 1 - 10
of 10
pro vyhledávání: '"Mawby, Phillip"'
Autor:
Deb, Arkadeep, Ortiz-Gonzalez, Jose, Taha, Mohamed, Jahdi, Saeed, Mawby, Phillip, Alatise, Olayiwola
Publikováno v:
Deb, A, Ortiz-Gonzalez, J, Taha, M, Jahdi, S, Mawby, P & Alatise, O 2023, ' Impact of Turn-Off Gate Voltage and Temperature on Threshold Voltage Instability in Pulsed Gate Voltage Stresses of SiC MOSFETs ', Materials Science Forum, vol. 1091, pp. 61-66 . https://doi.org/10.4028/p-lidhbt
Bias temperature instability (BTI) in SiC MOSFETs has come under significant academic and industrial research. Threshold voltage (VTH) shift due to gate voltage stress has been demonstrated in several studies investigating gate oxide reliability in S
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=od______2642::8720155abf2c3bcfe41e7ce31e1ef0cb
https://research-information.bris.ac.uk/en/publications/2f6d3606-e1a8-4fe4-b162-eaa1e8bb63b0
https://research-information.bris.ac.uk/en/publications/2f6d3606-e1a8-4fe4-b162-eaa1e8bb63b0
Autor:
Renz, Arne Benjamin, Cao, Qin Ze, Vavasour, Oliver James, Gott, James, Gammon, Peter M., Dai, Tian Xiang, Baker, G.W.C., Mawby, Phillip, Shah, Vishal
Publikováno v:
Materials Science Forum; May 2023, Vol. 1090 Issue: 1 p147-151, 5p
Autor:
Almpanis, Ioannis, Evans, Paul, Antoniou, Marina, Gammon, Peter M., Empringham, Lee, Udrea, Florin, Mawby, Phillip, Lophithis, Neophytos
Publikováno v:
Key Engineering Materials; May 2023, Vol. 946 Issue: 1 p125-133, 9p
Autor:
Renz, A. Benjamin, Vavasour, Oliver J., Rommel, Mathias, Baker, G.W.C., Gammon, Peter M., Dai, Tian Xiang, Li, Fan, Antoniou, Marina, Mawby, Phillip A., Shah, Vish Al
Publikováno v:
Materials Science Forum; May 2022, Vol. 1062 Issue: 1 p523-527, 5p
Autor:
Baker, G.W.C., Li, Fan, Dai, Tian Xiang, Renz, A. Benjamin, Zhang, Lu Yang, Qi, Yun Yi, Shah, Vish Al, Mawby, Phillip A., Antoniou, Marina, Gammon, Peter M.
Publikováno v:
Materials Science Forum; May 2022, Vol. 1062 Issue: 1 p514-518, 5p
Autor:
Zhang, Lu Yang, Dai, Tian Xiang, Gammon, Peter M., Lophitis, Neophytos, Udrea, Florin, Tiwari, Amit, Gonzalez, Jose Ortiz, Renz, A. Benjamin, Shah, Vish Al, Mawby, Phillip A., Antoniou, Marina
Publikováno v:
Materials Science Forum; May 2022, Vol. 1062 Issue: 1 p504-508, 5p
Autor:
Renz, A. Benjamin, Vavasour, Oliver J., Gammon, Peter M., Li, Fan, Dai, Tian Xiang, Baker, G.W.C., Grant, Nicholas, Murphy, John, Mawby, Phillip A., Shah, Vish Al
Publikováno v:
Materials Science Forum; May 2022, Vol. 1062 Issue: 1 p325-329, 5p
Autor:
Renz, A. Benjamin, Vavasour, Oliver J., Pérez-Tomás, Amador, Cao, Qin Ze, Shah, Vish Al, Bonyadi, Yeganeh, Pathirana, Vasantha, Trajkovic, Tanya, Baker, G.W.C., Mawby, Phillip A., Gammon, Peter M.
Publikováno v:
Materials Science Forum; May 2022, Vol. 1062 Issue: 1 p190-194, 5p
Autor:
Lophitis, Neophytos, Gammon, Peter M., Renz, A. Benjamin, Dai, Tian Xiang, Tiwari, Amit, Trajkovic, Tanya, Mawby, Phillip A., Udrea, Florin, Antoniou, Marina
Publikováno v:
Materials Science Forum; May 2022, Vol. 1062 Issue: 1 p598-602, 5p
Publikováno v:
2013 15th European Conference on Power Electronics & Applications (EPE); 2013, p1-9, 9p