Zobrazeno 1 - 10
of 24
pro vyhledávání: '"Maud Baylac"'
Autor:
Julien Angot, Olli Tarvainen, Thomas Thuillier, Maud Baylac, Thierry Lamy, Patrick Sole, Josua Jacob
Publikováno v:
Physical Review Accelerators and Beams, Vol 21, Iss 10, p 104801 (2018)
To qualify electron cyclotron resonance charge breeders, the method that is traditionally used to evaluate the charge breeding time consists in generating a rising edge of the injected beam current and measuring the time in which the extracted multic
Externí odkaz:
https://doaj.org/article/303abb2aee9343dfb8ca945c7747889c
Autor:
Maud Baylac, Jean-Luc Biarrotte, Julien Billard, Dominique Boutigny, Chiara Caprini, Gabriel Chardin, Patrick Chardon, Pierre Cladé, Sabine Crépé-Renaudin, Hélène Courtois, Sylvain David, Sacha Davidson, Emmanuel Dartois, Mirella Del Nero, Jean Duprat, Josquin Errard, Fanny Farget, Berrie Giebels, Vladimir Vava Gligorov, Raphaël Granier De Cassagnac, Saida Guellati, Francesca Gulminelli, Ferid Haddad, Sébastien Incerti, Marc Knecht, Antoine Lemasson, Marianne Lemoine-Goumard, Anne Le Pennec, Araceli Lopez-Martens, Benoit Lott, Pierre-Etienne Macchi, Frédérique Marion, Jacques Marteau, Silvia Niccolai, Mathieu Perrin-Terrin, Guillaume Pignol, Vincent Poireau, Daniel Pomarède, Vivian Poulin, Laurent Serin, Justine Serrano, Yves Sirois, Olivier Sorlin, David Rousseau, Vincent Tatischeff, Teixeira, Ana M., Laurent Vacavant, Véronique Van Elewyck, Marco Zito, Fabian Zomer
Publikováno v:
Ursula Bassler. CNRS Editions, 2022, 9782271143808
HAL
HAL
International audience; L’immensité de notre Univers ne cesse d’intriguer et de stimuler les imaginations.Pour mieux appréhender l’infiniment grand et l’histoire de l’Univers depuis ses tout premiers instants, il faut se tourner vers un a
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::1eef7732ff8e997e6d59558ff712f0f8
https://hal.in2p3.fr/in2p3-03967455
https://hal.in2p3.fr/in2p3-03967455
Autor:
Thomas Andre, Julien Angot, Maud Baylac, Pierre Olivier Dumont, Thierry Lamy, Patrick Sole, Thomas Thuillier, Francois Debray, Ivan Izotov, Vadim Skalyga
Publikováno v:
J.Phys.Conf.Ser.
19th International Conference on Ion Sources
19th International Conference on Ion Sources, Sep 2021, Online, Canada. pp.012014, ⟨10.1088/1742-6596/2244/1/012014⟩
19th International Conference on Ion Sources
19th International Conference on Ion Sources, Sep 2021, Online, Canada. pp.012014, ⟨10.1088/1742-6596/2244/1/012014⟩
SEISM is a unique ECR ion source operating at a frequency of 60 GHz. The prototype is based on a simple magnetic geometry, the cusp, allowing the use of polyhelix coils (developed with LNCMI, Grenoble) to generate the closed ECR surface at 2.14T. The
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::dd681ca1262141d14ee48a3e8275e696
https://hal.archives-ouvertes.fr/hal-03657473
https://hal.archives-ouvertes.fr/hal-03657473
Autor:
B. Cheymol, Francisco J. Franco, Guillaume Hubert, Raoul Velazco, Hortensia Mecha, Maud Baylac, Solenne Rey, Golnaz Korkian, Juan Antonio Clemente, Juan Carlos Fabero
Publikováno v:
E-Prints Complutense. Archivo Institucional de la UCM
instname
IEEE Transactions on Nuclear Science
IEEE Transactions on Nuclear Science, Institute of Electrical and Electronics Engineers, 2020, 67 (7), pp.1461-1469. ⟨10.1109/TNS.2020.2977874⟩
E-Prints Complutense: Archivo Institucional de la UCM
Universidad Complutense de Madrid
instname
IEEE Transactions on Nuclear Science
IEEE Transactions on Nuclear Science, Institute of Electrical and Electronics Engineers, 2020, 67 (7), pp.1461-1469. ⟨10.1109/TNS.2020.2977874⟩
E-Prints Complutense: Archivo Institucional de la UCM
Universidad Complutense de Madrid
International audience; A sensitivity characterization of a Xilinx Artix-7 field programmable gate array (FPGA) against 14.2-MeV neutrons is presented. The content of the internal static random access memories (SRAMs) and flip-flops was downloaded in
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::7bab2f02eab26f83ebe1c1da7543c2c2
https://eprints.ucm.es/59496/
https://eprints.ucm.es/59496/
Autor:
Carlos Valadares, Raoul Velazco, B. Cheymol, Matheus Garay Trindade, Solenne Rey, Maud Baylac, Raphael A. C. Viera, Alexandre Siqueira Guedes Coelho, Rodrigo Possamai Bastos
Publikováno v:
IEEE Transactions on Nuclear Science
IEEE Transactions on Nuclear Science, Institute of Electrical and Electronics Engineers, 2019, 66 (7), pp.1441-1448. ⟨10.1109/TNS.2019.2920747⟩
IEEE Transactions on Nuclear Science, Institute of Electrical and Electronics Engineers, 2019, 66 (7), pp.1441-1448. ⟨10.1109/TNS.2019.2920747⟩
International audience; Hardware-implemented intelligent systems running autonomous functions and decisions are today becoming more and more ubiquitous in many fields of applications, demanding reliable operation even under harsh conditions as in nuc
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::085a7b6ffef36fe0fcca1e11c30d53c1
https://hal.archives-ouvertes.fr/hal-02193158
https://hal.archives-ouvertes.fr/hal-02193158
Publikováno v:
IEEE Transactions on Nuclear Science
IEEE Transactions on Nuclear Science, Institute of Electrical and Electronics Engineers, 2018, 65 (8), pp.1879-1886. ⟨10.1109/TNS.2018.2838526⟩
IEEE Transactions on Nuclear Science, Institute of Electrical and Electronics Engineers, 2018, 65 (8), pp.1879-1886. ⟨10.1109/TNS.2018.2838526⟩
This paper evaluates the error rate of a memory-bound application implemented in different commercial-off-the-shelf multicore and many-core processors. To achieve this goal, two quantitative experiments are performed: fault-injection campaigns and ra
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::1f460555421c933430cf85b5b53665dd
https://hal.archives-ouvertes.fr/hal-01806150
https://hal.archives-ouvertes.fr/hal-01806150
Autor:
Josua Jacob, Olli Tarvainen, J. Angot, Thomas Thuillier, Patrick Solé, Maud Baylac, T. Lamy, Myriam Migliore
Publikováno v:
AIP Conf.Proc.
17th International Conference on Ion Sources
17th International Conference on Ion Sources, Oct 2017, Geneva, Switzerland. pp.070005, ⟨10.1063/1.5053347⟩
17th International Conference on Ion Sources
17th International Conference on Ion Sources, Oct 2017, Geneva, Switzerland. pp.070005, ⟨10.1063/1.5053347⟩
International audience; PSC has developed the PHOENIX electron cyclotron resonance Charge Breeder since 2000. The performances have been improved over time acting on the 1+ and N+ beam optics, the base vacuum and the 1+ beam injection. A new objectiv
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::7cba47ad61a09278cfa289cfa0193b60
https://doi.org/10.1063/1.5053347
https://doi.org/10.1063/1.5053347
Autor:
Guillaume Hubert, Juan A. Fraire, Francesca Villa, Maud Baylac, Hortensia Mecha, Raoul Velazco, Solenne Rey, Helmut Puchner, Juan Antonio Clemente, Francisco J. Franco
Publikováno v:
IEEE Transactions on Nuclear Science
IEEE Transactions on Nuclear Science, Institute of Electrical and Electronics Engineers, 2018, 65 (8), pp.1858-1865. ⟨10.1109/TNS.2018.2800905⟩
IEEE Trans.Nucl.Sci.
IEEE Trans.Nucl.Sci., 2018, 65 (8), pp.1858-1865. ⟨10.1109/TNS.2018.2800905⟩
E-Prints Complutense: Archivo Institucional de la UCM
Universidad Complutense de Madrid
E-Prints Complutense. Archivo Institucional de la UCM
instname
IEEE Transactions on Nuclear Science, Institute of Electrical and Electronics Engineers, 2018, 65 (8), pp.1858-1865. ⟨10.1109/TNS.2018.2800905⟩
IEEE Trans.Nucl.Sci.
IEEE Trans.Nucl.Sci., 2018, 65 (8), pp.1858-1865. ⟨10.1109/TNS.2018.2800905⟩
E-Prints Complutense: Archivo Institucional de la UCM
Universidad Complutense de Madrid
E-Prints Complutense. Archivo Institucional de la UCM
instname
This paper presents a single event upset (SEU) sensitivity characterization at ultralow bias voltage of three generations of commercial off-the-shelf static random access memories (SRAMs) manufactured in 130-, 90-, and 65-nm CMOS processes. For this
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::7b1d4ee8c7961adf34c6816603d412f4
https://hal.archives-ouvertes.fr/hal-01872001
https://hal.archives-ouvertes.fr/hal-01872001
Publikováno v:
Phys.Rev.Accel.Beams
Phys.Rev.Accel.Beams, 2018, 21 (10), pp.104801. ⟨10.1103/PhysRevAccelBeams.21.104801⟩
Physical Review Accelerators and Beams
Physical Review Accelerators and Beams, American Physical Society, 2018, 21 (10), pp.104801. ⟨10.1103/PhysRevAccelBeams.21.104801⟩
Physical Review Accelerators and Beams, Vol 21, Iss 10, p 104801 (2018)
Phys.Rev.Accel.Beams, 2018, 21 (10), pp.104801. ⟨10.1103/PhysRevAccelBeams.21.104801⟩
Physical Review Accelerators and Beams
Physical Review Accelerators and Beams, American Physical Society, 2018, 21 (10), pp.104801. ⟨10.1103/PhysRevAccelBeams.21.104801⟩
Physical Review Accelerators and Beams, Vol 21, Iss 10, p 104801 (2018)
To qualify electron cyclotron resonance charge breeders, the method that is traditionally used to evaluate the charge breeding time consists in generating a rising edge of the injected beam current and measuring the time in which the extracted multic
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::421b7f813d920a9cbaf45fbd79c7ea59
https://hal.archives-ouvertes.fr/hal-01921965
https://hal.archives-ouvertes.fr/hal-01921965
Autor:
Vanessa Vargas, Pablo Ramos, Jean-François Méhaut, Raoul Velazco, Camille Jalier, Benoît Dupont de Dinechin, Maud Baylac, Francesca Villa, Nacer-Eddine Zergainoh, Renaud Stevens, Solenne Rey, Vincent Ray
Publikováno v:
IEEE Transactions on Nuclear Science
IEEE Transactions on Nuclear Science, Institute of Electrical and Electronics Engineers, 2017, 64 (1), pp.483-490. ⟨10.1109/TNS.2016.2638081⟩
IEEE Transactions on Nuclear Science, 2017, 64 (1), pp.483-490. ⟨10.1109/TNS.2016.2638081⟩
IEEE Transactions on Nuclear Science, Institute of Electrical and Electronics Engineers, 2017, 64 (1), pp.483-490. ⟨10.1109/TNS.2016.2638081⟩
IEEE Transactions on Nuclear Science, 2017, 64 (1), pp.483-490. ⟨10.1109/TNS.2016.2638081⟩
International audience; This work evaluates the SEE static and dynamic sensitivityof a single-chip many-core processor having implemented16 compute clusters, each one with 16 processing cores. The SEUerror-rate of an application implemented in the de
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::4f8e3cf197c63e4adcd423f2e1821173
https://hal.archives-ouvertes.fr/hal-01459823
https://hal.archives-ouvertes.fr/hal-01459823