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Autor:
Günther Schindler, Rainer Waser, Walter Hartner, Mattias Ahlstedt, Christine Dehm, Carlos Mazure, Herbert Schroeder, Volker Weinrich
Publikováno v:
Integrated Ferroelectrics. 27:213-225
After patterning the Platinum/crystalline SrBi2Ta2O9 bilayer by Argon based Reactive Ion Etching (RIE), a degradation of the remanent polarization and leakage current of the capacitors for smaller feature sizes is observed. To simulate the study of t