Zobrazeno 1 - 7
of 7
pro vyhledávání: '"Mattia Giulianini"'
Autor:
Gerardo Malavena, Salvatore M. Amoroso, Andrew R. Brown, Plamen Asenov, Xi-Wei Lin, Victor Moroz, Mattia Giulianini, David Refaldi, Christian Monzio Compagnoni, Alessandro S. Spinelli
Publikováno v:
IEEE Journal of the Electron Devices Society, Vol 12, Pp 651-657 (2024)
In this two-part article we discuss the difference between a continuous and a discrete approach to trap modeling in the simulation of 3-D NAND Flash memories with polysilicon channel. In Part I we focus on threshold voltage $({\mathrm { V}}_{\mathrm
Externí odkaz:
https://doaj.org/article/b7afce161e184ff092a9374d9c9526b5
Autor:
Gerardo Malavena, Salvatore M. Amoroso, Andrew R. Brown, Plamen Asenov, Xi-Wei Lin, Victor Moroz, Mattia Giulianini, David Refaldi, Christian Monzio Compagnoni, Alessandro S. Spinelli
Publikováno v:
IEEE Journal of the Electron Devices Society, Vol 12, Pp 658-661 (2024)
In Part II of this article we discuss the impact of a discrete treatment of traps on 3-D NAND Flash random telegraph noise (RTN). A higher RTN results when discrete traps are taken into account, that can only be explained by a stronger influence of t
Externí odkaz:
https://doaj.org/article/09c859b81e254e71b8dbdeb8f936cf18
Autor:
Gerardo Malavena, Mattia Giulianini, Luca Chiavarone, Alessandro S. Spinelli, Christian Monzio Compagnoni
Publikováno v:
IEEE Journal of the Electron Devices Society, Vol 11, Pp 524-530 (2023)
In this paper, we present a detailed experimental investigation of high-temperature data retention in 3D floating-gate NAND Flash memory arrays. Data reveal that charge detrapping from the cell tunnel oxide and depassivation of traps in the string po
Externí odkaz:
https://doaj.org/article/6397aec38f21473f9cfd0251938db086
Autor:
Mattia Giulianini, Gerardo Malavena, Luca Chiavarone, Alessandro S. Spinelli, Christian Monzio Compagnoni
Publikováno v:
2023 IEEE International Reliability Physics Symposium (IRPS).
Autor:
Gerardo Malavena, Mattia Giulianini, Luca Chiavarone, Alessandro S. Spinelli, Christian Monzio Compagnoni
Publikováno v:
IEEE Electron Device Letters. 43:557-560
Autor:
Gerardo Malavena, Mattia Giulianini, Christian Monzio Compagnoni, Luca Chiavarone, Alessandro S. Spinelli
Publikováno v:
2022 IEEE International Conference on Emerging Electronics (ICEE).