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pro vyhledávání: '"Matthieu Verdy"'
Autor:
Jean-Pascal Mallet, Cedric Mayor, Suzanne Lesecq, Matthieu Verdy, Emeric de Foucauld, Dominique Morche
Publikováno v:
NEWCAS
Reducing test costs of analog and RF circuits is a complex challenge, for which intuitive solution is to reduce test time. However, such reduction usually leads to a degradation of measurement accuracy not easy to handle when no model is available to
Autor:
Jean-Pascal Mallet, Emeric de Foucauld, Matthieu Verdy, Suzanne Lesecq, Cedric Mayor, Alin Ratiu, Dominique Morche
Publikováno v:
ICECS
In this paper, we introduce a new method for improving the use of Alternative Measurements Strategy for analog circuit testing. The goal is to reduce the test cost by selecting the cheapest set of measurements that do not bring redundant information