Zobrazeno 1 - 6
of 6
pro vyhledávání: '"Matthieu Beaumel"'
Autor:
Charles Sellier, Jean-Marc Belloir, Didier Gambart, Julien Bezine, Wissam Mouallem, Dominique Blain, Matthieu Beaumel, Antoine Vriet, Cedric Virmontois, E. Garcia-Sanchez, N. Perrot, A. Bardoux
Publikováno v:
IEEE Transactions on Nuclear Science. 66:104-110
This paper focuses on the radiation-induced dose and single-event effects (SEEs) on a color CMOS camera designed for space missions. The $\gamma $ -ray and proton tests are used to evaluate the tolerance against cumulative dose effects. The dark curr
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::6708f5c3fc2a687a2a0caf82664a2f03
https://doi.org/10.1109/tns.2018.2885822
https://doi.org/10.1109/tns.2018.2885822
Publikováno v:
IEEE Transactions on Nuclear Science
IEEE Transactions on Nuclear Science, Institute of Electrical and Electronics Engineers, 2018, 65 (8), pp.1676-1684. ⟨10.1109/TNS.2018.2800903⟩
IEEE Transactions on Nuclear Science, Institute of Electrical and Electronics Engineers, 2018, 65 (8), pp.1676-1684. ⟨10.1109/TNS.2018.2800903⟩
International audience; In-flight dark current nonuniformity measurements performed on three different satellites [JASON-2, SPRINT-A, and SAT-X (name withheld)] are compared to ground calculations. The standard deviation of the DCNU is calculated usi
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::de414293d58d913ea19dce52593d6845
https://hal.archives-ouvertes.fr/hal-01883514
https://hal.archives-ouvertes.fr/hal-01883514
Autor:
Christophe Inguimbert, M. C. Ursule, Dominique Herve, D. Falguere, M Poizat, Matthieu Beaumel, T. Nuns
Publikováno v:
IEEE Transactions on Nuclear Science. 61:3323-3330
The 3D Monte Carlo transport code GEANT 4 was used to simulate the Dark Current Non Uniformity of image sensors. The method includes three different physical processes: the Coulombic scattering, the nuclear elastic interaction and the nuclear inelast
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e0d2d9a8ec6aa219ac7fd263d0391745
https://doi.org/10.1109/tns.2014.2364332
https://doi.org/10.1109/tns.2014.2364332
Publikováno v:
IEEE Transactions on Nuclear Science. 61:1909-1917
The single event effects (SEEs) sensitivity of the HAS2 CMOS image sensor has been characterized with protons, electrons, and heavy ions. The read-out integrated circuit (ROIC) of the sensor was found to be sensitive to charged particle-induced upset
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::125176e5c36877e123dcb8b92c567c82
https://doi.org/10.1109/tns.2014.2307759
https://doi.org/10.1109/tns.2014.2307759
Publikováno v:
SPIE Proceedings.
Experimental results of several radiation test campaigns performed on the HAS2 CMOS imager are presented. The radiation testing includes Cobalt-60 total ionizing dose at low and high dose rate, proton and electron displacement damage, proton induced
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::7dcdd74336caaf9cbc35df83579a0ad8
https://doi.org/10.1117/12.829983
https://doi.org/10.1117/12.829983
Publikováno v:
2009 European Conference on Radiation and Its Effects on Components and Systems.
We present the key results of multiple radiation characterization campaigns of the HAS2 radiation-hardened active pixel sensor (APS). These characterizations encompassed Cobalt-60 total ionizing dose, proton and electron displacement damage tests at
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::333c91d63ccfbe330b9c879fe45a45aa
https://doi.org/10.1109/radecs.2009.5994709
https://doi.org/10.1109/radecs.2009.5994709