Zobrazeno 1 - 10
of 16
pro vyhledávání: '"Matthias Weißer"'
Autor:
Haiko Wittkämper, Rainer Hock, Matthias Weißer, Johannes Dallmann, Carola Vogel, Narayanan Raman, Nicola Taccardi, Marco Haumann, Peter Wasserscheid, Tzung-En Hsieh, Sven Maisel, Michael Moritz, Christoph Wichmann, Johannes Frisch, Mihaela Gorgoi, Regan G. Wilks, Marcus Bär, Mingjian Wu, Erdmann Spiecker, Andreas Görling, Tobias Unruh, Hans-Peter Steinrück, Christian Papp
Publikováno v:
Scientific Reports, Vol 13, Iss 1, Pp 1-8 (2023)
Abstract Isolated active sites have great potential to be highly efficient and stable in heterogeneous catalysis, while enabling low costs due to the low transition metal content. Herein, we present results on the synthesis, first catalytic trials, a
Externí odkaz:
https://doaj.org/article/0e661ae390514d44b67aa1958b849efa
Autor:
Fabio Candolfi, Johannes A F Lehmeyer, Maximilian Rühl, Roland Nagy, Matthias Weisser, Michel Bockstedte, Michael Krieger, Heiko B Weber
Publikováno v:
New Journal of Physics, Vol 26, Iss 7, p 079501 (2024)
Externí odkaz:
https://doaj.org/article/17cafa8110bb48f0baf29092cce33ea3
Autor:
Haiko Wittkämper, Rainer Hock, Matthias Weißer, Johannes Dallmann, Carola Vogel, Narayanan Raman, Nicola Taccardi, Marco Haumann, Peter Wasserscheid, Tzung-En Hsieh, Sven Maisel, Michael Moritz, Christoph Wichmann, Johannes Frisch, Mihaela Gorgoi, Regan G. Wilks, Marcus Bär, Mingjian Wu, Erdmann Spiecker, Andreas Görling, Tobias Unruh, Hans-Peter Steinrück, Christian Papp
Publikováno v:
Scientific Reports, Vol 13, Iss 1, Pp 1-1 (2023)
Externí odkaz:
https://doaj.org/article/eb6c454a8cb44608a8287c685686d7fc
Autor:
Maximilian Rühl, Johannes Lehmeyer, Roland Nagy, Matthias Weisser, Michel Bockstedte, Michael Krieger, Heiko B Weber
Publikováno v:
New Journal of Physics, Vol 23, Iss 7, p 073002 (2021)
We present a photoluminescence (PL) study of the recently discovered TS defect in 4H silicon carbide. It investigates the influence of static electric fields and local strain on the spectral properties by means of low temperature (≈4 K) ensemble me
Externí odkaz:
https://doaj.org/article/3145933a81e9456c86e0c459ff7233fd
Autor:
Roland Weingärtner, Tobias Unruh, Stephan Müller, Sven Besendörfer, Ulrich Bläß, Matthias Weisser, Elke Meissner, Boris M. Epelbaum, Thomas Wicht
Publikováno v:
Journal of Applied Crystallography
AlN single crystals grown by physical vapor transport have been analyzed by X-ray methods to evaluate dislocation types, densities and spatial distribution within the crystal. Potential changes of the AlN crystal quality during growth, both within th
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::a238242efed6f6c3986d65029876b97c
Autor:
Matthias Weisser, Nicola Taccardi, Zoran Miličević, Peter Wasserscheid, David M. Smith, Michael Klimczak, Andreas Magerl, Ana-Sunčana Smith, Zlatko Brkljača
Publikováno v:
The Journal of Physical Chemistry Letters. 6:549-555
Understanding the molecular-level behavior of ionic liquids (ILs) at IL-solid interfaces is of fundamental importance with respect to their application in, for example, electrochemical systems and electronic devices. Using a model system, consisting
Publikováno v:
physica status solidi (a). 211:2450-2454
The radial oxygen nucleation and precipitation in Czochralski-grown silicon crystals is observed in real time via the local evolution of the X-ray Bragg intensity. Using a high X-ray energy and a divergent beam setup, it becomes possible to examine t
Publikováno v:
Solid State Phenomena. :631-636
The build-up of strain fields caused by the precipitation of oxygen in Czochralski-silicon during annealing up to 1200°C and for process times up to 70 hours has been observed in real time by high energy x-ray diffraction. Five different processes a
Publikováno v:
Journal of Applied Crystallography. 37:901-910
A triple-axis diffractometer for high-energy X-ray diffraction is described. A 450 kV/4.5 kW stationary tungsten X-ray tube serves as the X-ray source. Normally, 220 reflections of thermally annealed Czochralski Si are employed for the monochromator
Autor:
Patrick Desperrier, M. Maier, Ralf R. Muller, Christoph Seitz, Peter J. Wellmann, Albrecht Winnacker, Andreas Magerl, Matthias Weisser
Publikováno v:
Materials Science Forum. :723-726