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pro vyhledávání: '"Matthias Schamel"'
Autor:
Ralph Spolenak, Alla S. Sologubenko, Jeffrey M. Wheeler, Matthias Schamel, Johann Michler, Christoph Niederberger
Publikováno v:
Philosophical Magazine. 96:3479-3501
Various parameters from fabrication and testing are known to influence the behaviour for microcompression experiments, especially the work-hardening behaviour. In this regard, the most important factor is found to be the availability of unconstrained
Publikováno v:
Advanced Engineering Materials. 14:975-980
A cyclic bending test with cantilever geometry is developed for probing local mechanical properties of single crystalline Cu nanowhiskers (NWs). A lower limit for the yield stress for such whiskers is derived at ≈5 GPa. Since all NWs exhibit the ax
Autor:
Jonathan N. Coleman, Allen T. Bellew, Jamil Elias, John J. Boland, Matthias Schamel, Philip E. Lyons, Laetitia Philippe, Sukanta De
Publikováno v:
The Journal of Physical Chemistry Letters. 2:3058-3062
We report the deposition and characterization of thin networks of gold nanowires on plastic substrates. The average nanowire diameter was 47 nm, while the networks had mean thicknesses in the range of 35–750 nm. The conductivity of networks with me
Autor:
Matthias Schamel, Horst P. Strunk, Gunther Richter, Christian Kappel, Dominic Linsler, Lisa Hofacker, S. Haag, Carola Schopf
Publikováno v:
International Journal of Materials Research. 102:828-836
One-dimensional structures are starting to have impact in modern technological device design. A brief history of the fabrication of metal structures in such geometries is presented. At the dawn of modern science, in 1574, a recipe was published for t
Autor:
Matthias Schamel
Publikováno v:
Management-Reihe Corporate Social Responsibility ISBN: 9783642551871
Die Ausgangslage: Ein traditionsreiches Familienunternehmen, das qualitativ hochwertige Lebensmittel herstellt, Marktfuhrer und alteste Meerrettichmarke der Welt. Und dennoch unter Preisdruck. Schamel spricht daher von ehrlichen und leistungsgerechte
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::2830e65da5fe8b75cccc40598a0ea35e
https://doi.org/10.1007/978-3-642-55188-8_10
https://doi.org/10.1007/978-3-642-55188-8_10
Reflectance anisotropy spectroscopy as a tool for mechanical characterization of metallic thin films
Autor:
Matthias Schamel, Michael Hohage, Richard Denk, Peter Zeppenfeld, Alla S. Sologubenko, Ralph Spolenak, Andi Wyss
Publikováno v:
Journal of Physics D: Applied Physics. 48:415303
In the present work reflectance anisotropy spectroscopy (RAS) is evaluated as a new tool for the mechanical characterization of metallic thin films on viscoelastic substrates. Cu and Cu–Zn thin films of thicknesses in the range from 50 to 1000 nm w