Zobrazeno 1 - 10
of 272
pro vyhledávání: '"Matthew R, Linford"'
Publikováno v:
Hybrid Advances, Vol 5, Iss , Pp 100157- (2024)
We suggest a new approach for collecting data, with accompanying statistical analysis, that could be useful for assessing sample damage in X-ray Photoelectron Spectroscopy (XPS) and for target detection in XPS imagining. It is based on the concept of
Externí odkaz:
https://doaj.org/article/6642bf51513248b7be4a34e633f3d1f3
Autor:
Joshua W. Pinder, George H. Major, Donald R. Baer, Jeff Terry, James E. Whitten, Jan Čechal, Jacob D. Crossman, Alvaro J. Lizarbe, Samira Jafari, Christopher D. Easton, Jonas Baltrusaitis, Matthijs A. van Spronsen, Matthew R. Linford
Publikováno v:
Applied Surface Science Advances, Vol 19, Iss , Pp 100534- (2024)
Despite numerous tutorials and standards written to the technical community on X-ray photoelectron spectroscopy (XPS), difficulties with data acquisition, analysis, and reporting persist. This work focuses on common errors in XPS that are frequently
Externí odkaz:
https://doaj.org/article/043c0df989af4c78811d052c13777431
Autor:
Dhananjay I. Patel, Tuhin Roychowdhury, Collin Jacobsen, Colton Myers, Jason S. Herrington, Matthew R. Linford
Publikováno v:
Separations, Vol 8, Iss 12, p 228 (2021)
We report the first fabrication of sputtered carbon, solid-phase microextraction (SPME) fibers. These fibers have competitive extraction capabilities compared with the commercial carbon wide range (CWR) SPME fiber. This report also includes a demonst
Externí odkaz:
https://doaj.org/article/b2e3bf9d08d84c68b2bfc8341ea4c096
Autor:
Kevin R. Laughlin, Sarah Jamieson, Anthony C. Pearson, Hao Wang, Richard R. Vanfleet, Robert C. Davis, Matthew R. Linford, Barry M. Lunt
Publikováno v:
ACS Omega, Vol 2, Iss 6, Pp 2432-2438 (2017)
Externí odkaz:
https://doaj.org/article/30e2f2f352034990a1ec888042773d93
Autor:
Behnam Moeini, Tahereh Avval, Hidde Brongersma, Stanislav Průša, Pavel Bábík, Elena Vaníčková, Brian R Strohmeier, David S Bell, Dennis Eggett, Steven M George, Matthew R Linford
Delayed atomic layer deposition (ALD) of ZnO, i.e., area selective (AS)-ALD, was successfully achieved on silicon wafers (Si/SiO2) terminated with tris(dimethylamino)methylsilane (TDMAMS). This resist molecule was deposited in a home-built, near atmo
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::21c73476886a6e13c3ae26c4334a69c6
https://doi.org/10.20944/preprints202305.2043.v1
https://doi.org/10.20944/preprints202305.2043.v1
Publikováno v:
Surface and Interface Analysis.
Autor:
Behnam Moeini, Matthew R. Linford
Publikováno v:
Surface and Interface Analysis.
Autor:
George H. Major, B. Maxwell Clark, Kevin Cayabyab, Nathan Engel, Christopher D. Easton, Jan Čechal, Donald R. Baer, Jeff Terry, Matthew R. Linford
Publikováno v:
Journal of Vacuum Science & Technology A. 41
This study was motivated by earlier observations. It is a systematic examination of the adequacy of reporting of information (metadata) necessary to understand x-ray photoelectron spectroscopy (XPS) data collection and data analysis in the scientific
Autor:
George H. Major, Joshua W. Pinder, Daniel E. Austin, Donald R. Baer, Steven L. Castle, Jan Čechal, B. Maxwell Clark, Hagai Cohen, Jonathan Counsell, Alberto Herrera-Gomez, Pavitra Govindan, Seong H. Kim, David J. Morgan, Robert L. Opila, Cedric J. Powell, Stanislav Průša, Adam Roberts, Mario Rocca, Naoto Shirahata, Tomáš Šikola, Emily F. Smith, Regina C. So, John E. Stovall, Jennifer Strunk, Andrew Teplyakov, Jeff Terry, Stephen G. Weber, Matthew R. Linford
Publikováno v:
Journal of Vacuum Science & Technology A. 41
Due to significant advances in instrumentation, many previously specialized techniques have become “routine” in user facilities. However, detailed knowledge held by experts has often not been relayed to general users, so they often rely on entry-
Autor:
Tahereh G. Avval, Stanislav Průša, Cody V. Cushman, Grant T. Hodges, Sarah Fearn, Seong H. Kim, Jan Čechal, Elena Vaníčková, Pavel Bábík, Tomáš Šikola, Hidde H. Brongersma, Matthew R. Linford
Publikováno v:
Applied Surface Science, 607:154551. Elsevier
Surface silanols (SiOH) are important moieties on glass surfaces. Here we present a tag-and-count approach for determining surface silanol densities, which consists of tagging surface silanols with Zn via atomic layer deposition (ALD) followed by det