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pro vyhledávání: '"Matt Knowles"'
Autor:
Manish Sharma, Gaurav Veda, Soumya Mittal, Martin E. Parley, Kun Young Chung, Shaun Nicholson, Wu-Tung Cheng, Matt Knowles
Publikováno v:
International Symposium for Testing and Failure Analysis.
This paper presents a new method for improving the quality and effectiveness of scan-based tests. The method, called statistical diagnosis, leverages defect likelihoods learned from analyzing populations of failing die instead of analyzing each die i
Autor:
Kannan Sekar, Neerja Bawaskar, Huaxing Tang, Matt Knowles, Gaurav Veda, Wu-Tung Cheng, Manish Sharma, Douglas Gehringer, Yan Pan, Jayant D'Souza
Publikováno v:
2019 30th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC).
Device complexity is reaching all-time highs with the adoption of high aspect ratio FinFETs created using multi- patterning process technologies. Simultaneously, new product segments such as AI and automotive are being fabricated on such advanced pro