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pro vyhledávání: '"Matias G. Babenco"'
Autor:
Jongho Lee, Stephen McDonnell, Matias G. Babenco, Domingo Ferrer, Robert M. Wallace, Deji Akinwande, Harry Chou, Li Tao, Milo Holt, Rodney S. Ruoff, Sanjay K. Banerjee
Publikováno v:
The Journal of Physical Chemistry C. 116:24068-24074
This article demonstrated monolayer graphene grown on annealed Cu (111) films on standard oxidized 100-mm Si wafers with higher quality than existing reports. Large area Raman mapping indicated high uniformity (>97% coverage) of monolayer graphene wi
Publikováno v:
SPIE Proceedings.
Raman spectroscopy is a widely used metric to characterize the quality of graphene films prepared by exfoliation or synthesis. As research on graphene advances and graphene is grown over large scales, mapping of growth surface and analysis of Raman s