Modeling of Electromagnetic Fault Injection

Autor: Philippe Maurine, Mathieu Lisart, Mathieu Dumont

Publikováno v: 2019 12th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo).

Electromagnetic Fault Injection (EMFI) has recently gained popularity as a mean to induce faults because of its inherent advantages. Despite this popularity, there is only little information on how EMFI generates faults. Within this context, this pap

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::8951e190f414bec55d16a3612f3632b3
https://doi.org/10.1109/emccompo.2019.8919964

SEU sensitivity and modeling using picosecond pulsed laser stimulation of a D Flip-Flop in 40 nm CMOS technology

Autor: Alexandre Sarafianos, Mathieu Lisart, Bruno Robisson, Jean-Max Dutertre, Nicolas Borrel, Clement Champeix

Publikováno v: Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS), 2015 IEEE International Symposium on
Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS), 2015 IEEE International Symposium on, Oct 2015, Amherst, United States. ⟨10.1109/DFT.2015.7315158⟩
DFTS

International audience; —This paper presents the design of a CMOS 40 nm D Flip-Flop cell and reports the laser fault sensitivity mapping both with experiments and simulation results. Theses studies are driven by the need to propose a simulation met

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::759d0baa004f86b7013f5b88d17bde2b
https://hal-emse.ccsd.cnrs.fr/emse-01227355

Experimental validation of a Bulk Built-In Current Sensor for detecting laser-induced currents

Autor: Bruno Robisson, Clement Champeix, Nicolas Borrel, Jean-Max Dutertre, Alexandre Sarafianos, Mathieu Lisart

Publikováno v: On-Line Testing Symposium (IOLTS), 2015 IEEE 21st International
On-Line Testing Symposium (IOLTS), 2015 IEEE 21st International, Jul 2015, Halkidiki, Greece. ⟨10.1109/IOLTS.2015.7229849⟩
IOLTS

International audience; —Bulk Built-In Current Sensors (BBICS) were developed to detect the transient bulk currents induced in the bulk of integrated circuits when hit by ionizing particles or pulsed laser. This paper reports the experimental evalu

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::5b64607a19543ad795568c986214f0be
https://hal-emse.ccsd.cnrs.fr/emse-01227307/document

Influence of triple-well technology on laser fault injection and laser sensor efficiency

Autor: A. Sarafianos, Edith Kussener, J-M. Dutertre, Mathieu Lisart, Nicolas Borrel, W. Rahajandraibe, Clement Champeix

Publikováno v: Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS), 2015 IEEE International Symposium on
Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS), 2015 IEEE International Symposium on, Apr 2015, Monterey, United States. ⟨10.1109/DFT.2015.7315141⟩
2015 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS)
IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS 2015)
IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS 2015), Oct 2015, Amherst, MA, United States. ⟨10.1109/DFT.2015.7315141⟩
DFTS

International audience; This study is driven by the need to understand the influence of a Deep-Nwell implant on the sensitivity of integrated circuits to laser-induced fault injections. CMOS technologies can be either dual-well or triple-well. Triple

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::d83a50e68b0137be8a2c09894e10e85a
https://hal-emse.ccsd.cnrs.fr/emse-01230166

Characterization and simulation of a body biased structure in triple-well technology under pulsed photoelectric laser stimulation

Autor: Wenceslas Rahajandraibe, Nicolas Borrel, Mathieu Lisart, Alexandre Sarafianos, Jean-Max Dutertre, Clement Champeix, Edith Kussener

Publikováno v: International Symposium for Testing and Failure Analysis (ISTFA)
International Symposium for Testing and Failure Analysis (ISTFA), Nov 2014, Houston, United States
Scopus-Elsevier
HAL

This study is driven by the need to optimize failure analysis methodologies based on laser/silicon interactions inside an integrated circuit using a triple-well process. It is therefore mandatory to understand the behavior of elementary devices to la

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::2dff260a7b936cb26c51c4f809118939
https://hal-emse.ccsd.cnrs.fr/emse-01099035