Zobrazeno 1 - 2
of 2
pro vyhledávání: '"Mathias Terheggen"'
Autor:
Sally Asher, Dean H. Levi, Mathias Terheggen, Wolfram Jaegermann, P.D. Paulson, Brian E. McCandless, Ken Durose, James R. Sites, Glenn Teeter, Helio Moutinho, Craig L. Perkins, Wyatt K. Metzger
Publikováno v:
Progress in Photovoltaics: Research and Applications. 12:177-217
The principal techniques used in the physical characterization of thin-film solar cells and materials are reviewed, these being scanning probe microscopy (SPM), X-ray diffraction (XRD), spectroscopic ellipsometry, transmission electron microscopy (TE
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::15b8de637c17b6b76d4924789ac23670
https://doi.org/10.1002/pip.542
https://doi.org/10.1002/pip.542
Autor:
Ken Durose, Sally E. Asher, Wolfram Jaegermann, Dean Levi, Brian E. McCandless, Wyatt Metzger, Helio Moutinho, P.D. Paulson, Craig L. Perkins, James R. Sites, Glenn Teeter, Mathias Terheggen
Publikováno v:
Progress in Photovoltaics; Mar2004, Vol. 12 Issue 2/3, p177-217, 41p