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pro vyhledávání: '"Matan Segal"'
Autor:
R. Iris Bahar, Yi Sun, Theodore W. Manikas, Matan Segal, Jennifer Dworak, Lakshmi Ramakrishnan, Kundan Nepal, Hui Jiang
Publikováno v:
ICECS
Excessive power during in–field testing can cause multiple issues, including invalidation of the test results, over- heating, and damage to the circuit. In this paper, we evaluate the reduction of capture power when specific segments of a scan chai