Zobrazeno 1 - 10
of 115
pro vyhledávání: '"Massimo Vanzi"'
Autor:
Massimo Vanzi
Publikováno v:
Photonics, Vol 8, Iss 12, p 542 (2021)
Optical gain and optical losses are separately measured in commercial laser diodes by simple analysis of spectral and electrical characteristics, and with no special specimen preparation or handling. The aim is to bring device analysis, for character
Externí odkaz:
https://doaj.org/article/ccd9ec36d98e41459646027028770f0e
Autor:
Massimo Vanzi
In the past few years, several authors have proposed and developed a model for laser diodes based on a newversion of the rate equations for photons and charges.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a82573beb99ebc971c1500a868f06660
https://doi.org/10.1016/b978-1-78548-154-3.50004-5
https://doi.org/10.1016/b978-1-78548-154-3.50004-5
The starting point is the acquisition of DC data, as usual for drawing the socalled LIV plot, as shown, where current I, optical power P out and the externally applied voltage Vext are drawn together.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ef5f0e87696ec11a3f46f73dcbd90eb2
https://doi.org/10.1016/b978-1-78548-154-3.50005-7
https://doi.org/10.1016/b978-1-78548-154-3.50005-7
Autor:
Laurent Béchou, Daniel T. Cassidy, Yves Danto, Yannick Deshayes, Mitsuo Fukuda, Samuel K.K. Lam, Giulia Marcello, Laurent Mendizabal, Giovanna Mura, Yves Ousten, Valerio Sanna Valle, Massimo Vanzi, Frédéric Verdier
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ac20bdaac777bf9e7978008e289f0968
https://doi.org/10.1016/b978-1-78548-154-3.50011-2
https://doi.org/10.1016/b978-1-78548-154-3.50011-2
Publikováno v:
Microelectronics Reliability. :859-863
A modified Hakki-Paoli method, for measuring optical gain in laser diodes, proposed at the past ESREF 2017 conference is here further improved in terms of practical implementation. In particular, averaging both the spectral function and its reciproca
Publikováno v:
Journal of Electronic Materials. 47:4959-4963
Gallium-nitride-based diode lasers were intentionally damaged using single sub-μs current pulses. This approach provoked catastrophic optical damage, a known sudden degradation mechanism, which becomes evident as surface modification at the aperture
Advanced Laser Diode Reliability focuses on causes and effects of degradations of state-of-the-art semiconductor laser diodes. It aims to provide a tool for linking practical measurements to physical diagnostics. To this purpose, it reviews the curre