Electrical and Structural Properties of Ohmic Contacts of SiC Diodes Fabricated on Thin Wafers

Autor: Badalà, Paolo, Bongiorno, Corrado, Fiorenza, Patrick, Bellocchi, Gabriele, Smecca, Emanuele, Vivona, Marilena, Zignale, Marco, Massimino, Maurizio, Deretzis, Ioannis, Rascunà, Simone, Frazzica, Marcello, Boscaglia, Massimo, Roccaforte, Fabrizio, La Magna, Antonino, Alberti, Alessandra

Publikováno v: Diffusion and Defect Data Part B: Solid State Phenomena; August 2024, Vol. 359 Issue: 1 p97-103, 7p