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Autor:
Peters JJP; Advanced Microscopy Laboratory, CRANN, Trinity College Dublin, The University of Dublin, Dublin, Ireland.; School of Physics, Trinity College Dublin, The University of Dublin, Dublin, Ireland.; turboTEM Ltd., Dublin, Ireland., Reed BW; IDES Inc., Pleasanton, CA, USA., Jimbo Y; JEOL Ltd. Akishima, Tokyo, Japan., Noguchi K; JEOL Ltd. Akishima, Tokyo, Japan., Müller KH; Faculty of Engineering, Department of Materials, Imperial College London, London, UK., Porter A; Faculty of Engineering, Department of Materials, Imperial College London, London, UK., Masiel DJ; IDES Inc., Pleasanton, CA, USA., Jones L; Advanced Microscopy Laboratory, CRANN, Trinity College Dublin, The University of Dublin, Dublin, Ireland.; School of Physics, Trinity College Dublin, The University of Dublin, Dublin, Ireland.; turboTEM Ltd., Dublin, Ireland.
Publikováno v:
Science (New York, N.Y.) [Science] 2024 Aug 02; Vol. 385 (6708), pp. 549-553. Date of Electronic Publication: 2024 Aug 01.
Autor:
Reed BW; Integrated Dynamic Electron Solutions, Inc., Pleasanton, California 94588, USA., Moghadam AA; Integrated Dynamic Electron Solutions, Inc., Pleasanton, California 94588, USA., Bloom RS; Integrated Dynamic Electron Solutions, Inc., Pleasanton, California 94588, USA., Park ST; Integrated Dynamic Electron Solutions, Inc., Pleasanton, California 94588, USA., Monterrosa AM; Sandia National Laboratories, Albuquerque, New Mexico 87185, USA., Price PM; Sandia National Laboratories, Albuquerque, New Mexico 87185, USA., Barr CM; Sandia National Laboratories, Albuquerque, New Mexico 87185, USA., Briggs SA, Hattar K; Sandia National Laboratories, Albuquerque, New Mexico 87185, USA., McKeown JT; Lawrence Livermore National Laboratory, Livermore, California 94551, USA., Masiel DJ; Integrated Dynamic Electron Solutions, Inc., Pleasanton, California 94588, USA.
Publikováno v:
Structural dynamics (Melville, N.Y.) [Struct Dyn] 2019 Sep 23; Vol. 6 (5), pp. 054303. Date of Electronic Publication: 2019 Sep 23 (Print Publication: 2019).
Autor:
Ji S; KTH Royal Institute of Technology, Material Physics, Electrum 229, SE-16440 Kista, Sweden., Piazza L; KTH Royal Institute of Technology, Material Physics, Electrum 229, SE-16440 Kista, Sweden., Cao G; KTH Royal Institute of Technology, Material Physics, Electrum 229, SE-16440 Kista, Sweden., Park ST; Integrated Dynamic Electron Solutions, Inc. (IDES), Pleasanton, California 94588, USA., Reed BW; Integrated Dynamic Electron Solutions, Inc. (IDES), Pleasanton, California 94588, USA., Masiel DJ; Integrated Dynamic Electron Solutions, Inc. (IDES), Pleasanton, California 94588, USA., Weissenrieder J; KTH Royal Institute of Technology, Material Physics, Electrum 229, SE-16440 Kista, Sweden.
Publikováno v:
Structural dynamics (Melville, N.Y.) [Struct Dyn] 2017 Jul 17; Vol. 4 (5), pp. 054303. Date of Electronic Publication: 2017 Jul 17 (Print Publication: 2017).
Autor:
Bücker K; Institut de Physique et Chimie des Matériaux de Strasbourg, UMR 7504 CNRS, Université de Strasbourg, 23 rue du Loess, 67034 Strasbourg, France., Picher M; Institut de Physique et Chimie des Matériaux de Strasbourg, UMR 7504 CNRS, Université de Strasbourg, 23 rue du Loess, 67034 Strasbourg, France., Crégut O; Institut de Physique et Chimie des Matériaux de Strasbourg, UMR 7504 CNRS, Université de Strasbourg, 23 rue du Loess, 67034 Strasbourg, France., LaGrange T; Interdisciplinary Centre for Electron Microscopy, École Polytechnique Fédérale de Lausanne, 1015 Lausanne, Switzerland., Reed BW; Integrated Dynamic Electron Solutions, Inc., 5653 Stoneridge Drive 117, Pleasanton, CA 94588, USA., Park ST; Integrated Dynamic Electron Solutions, Inc., 5653 Stoneridge Drive 117, Pleasanton, CA 94588, USA., Masiel DJ; Integrated Dynamic Electron Solutions, Inc., 5653 Stoneridge Drive 117, Pleasanton, CA 94588, USA., Banhart F; Institut de Physique et Chimie des Matériaux de Strasbourg, UMR 7504 CNRS, Université de Strasbourg, 23 rue du Loess, 67034 Strasbourg, France. Electronic address: florian.banhart@ipcms.unistra.fr.
Publikováno v:
Ultramicroscopy [Ultramicroscopy] 2016 Dec; Vol. 171, pp. 8-18. Date of Electronic Publication: 2016 Aug 20.
Autor:
Gipson BR; Center for Cellular Imaging and Nano Analytics, Biozentrum, University Basel, WRO-1058 Mattenstrasse 26, CH-4058 Basel, Switzerland. bryant.gipson@rice.edu, Masiel DJ, Browning ND, Spence J, Mitsuoka K, Stahlberg H
Publikováno v:
Physical review. E, Statistical, nonlinear, and soft matter physics [Phys Rev E Stat Nonlin Soft Matter Phys] 2011 Jul; Vol. 84 (1 Pt 1), pp. 011916. Date of Electronic Publication: 2011 Jul 22.
Autor:
Sarahan MC; SuperSTEM Laboratory, STFC Daresbury, Keckwick Ln., Warrington, WA4 4AD, UK. msarahan@superstem.org, Chi M, Masiel DJ, Browning ND
Publikováno v:
Ultramicroscopy [Ultramicroscopy] 2011 Feb; Vol. 111 (3), pp. 251-7. Date of Electronic Publication: 2010 Nov 30.
Autor:
Masiel DJ; Department of Chemistry, University of California-Davis, One Shields Ave, Davis, CA 95616, USA. djmasiel@ucdavis.edu, Reed BW, Lagrange TB, Campbell GH, Guo T, Browning ND
Publikováno v:
Chemphyschem : a European journal of chemical physics and physical chemistry [Chemphyschem] 2010 Jul 12; Vol. 11 (10), pp. 2088-90.
Autor:
Reed BW; Physical and Life Sciences Directorate, Lawrence Livermore National Laboratory, Livermore, CA 94551, USA. reed12@llnl.gov, Armstrong MR, Browning ND, Campbell GH, Evans JE, LaGrange T, Masiel DJ
Publikováno v:
Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada [Microsc Microanal] 2009 Aug; Vol. 15 (4), pp. 272-81.
Autor:
Taheri ML; Chemistry, Materials, Earth & Life Sciences Directorate, Lawrence Livermore National Laboratory, Livermore, California, USA. mtaheri@coe.drexel.edu, Lagrange T, Reed BW, Armstrong MR, Campbell GH, DeHope WJ, Kim JS, King WE, Masiel DJ, Browning ND
Publikováno v:
Microscopy research and technique [Microsc Res Tech] 2009 Mar; Vol. 72 (3), pp. 122-30.