Zobrazeno 1 - 10
of 340
pro vyhledávání: '"Masayoshi, T."'
Publikováno v:
IEEE transactions on neural networks and learning systems [IEEE Trans Neural Netw Learn Syst] 2021 Sep; Vol. 32 (9), pp. 4178-4190. Date of Electronic Publication: 2021 Aug 31.
Autor:
Watanabe, S., Masayoshi, T., Hirokazu, K., Ayako, S., Keiko, Y., Midori, T., Akihide, W., Akiko, F.
Publikováno v:
In European Neuropsychopharmacology November 2020 40 Supplement 1:S317-S318
Autor:
Liu, Chunyang1,2 (AUTHOR), Zhao, Zhixin1 (AUTHOR) 230320010070@stu.haust.edu.cn, Zhou, Yifei1 (AUTHOR), Ma, Lin1 (AUTHOR), Sui, Xin1,3 (AUTHOR), Huang, Yan1 (AUTHOR), Yang, Xiaokang1 (AUTHOR), Ma, Xiqiang1,3 (AUTHOR)
Publikováno v:
Sensors (14248220). Aug2024, Vol. 24 Issue 16, p5357. 17p.
Autor:
Jiteurtragool N; School of Systems Engineering, Electronic and Photonic Engineering, Kochi University of Technology, Tosayamada, Kami City, Kochi 782-8502, Japan., Masayoshi T; School of Systems Engineering, Electronic and Photonic Engineering, Kochi University of Technology, Tosayamada, Kami City, Kochi 782-8502, Japan., San-Um W; Center of Excellence in Intelligent Systems Integration, Faculty of Engineering, Thai-Nichi Institute of Technology (TNI), 1771/1, Pattanakarn Rd, Suan Luang, Bangkok 10250, Thailand.
Publikováno v:
Entropy (Basel, Switzerland) [Entropy (Basel)] 2018 Feb 20; Vol. 20 (2). Date of Electronic Publication: 2018 Feb 20.
Akademický článek
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Autor:
Yuan Jun, Masayoshi, T.
Publikováno v:
2011 3rd International Conference on Computer Research & Development (ICCRD); 2011, p305-309, 5p
Autor:
Yuan Jun, Masayoshi, T.
Publikováno v:
2011 20th European Conference on Circuit Theory & Design (ECCTD); 2011, p885-888, 4p
Autor:
San-Um, W., Masayoshi, T.
Publikováno v:
Proceedings of 2010 IEEE International Symposium on Circuits & Systems (ISCAS); 2010, p1931-1934, 4p
Autor:
San-Um, W., Masayoshi, T.
Publikováno v:
2010 International Conference on Electrical Engineering/Electronics Computer Telecommunications & Information Technology (ECTI-CON); 2010, p203-207, 5p
Autor:
San-Um, W., Masayoshi, T.
Publikováno v:
2009 52nd IEEE International Midwest Symposium on Circuits & Systems; 2009, p1195-1198, 4p