Zobrazeno 1 - 10
of 29
pro vyhledávání: '"Masaru Takakura"'
Publikováno v:
Vacuum and Surface Science. 64:510-514
Publikováno v:
Microscopy and Microanalysis. 28:1014-1015
Autor:
A. S. Pirozhkov, T. Murano, Masato Koike, Tadashi Hatano, Masaru Takakura, Hiroyuki Sasai, Tetsuya Nagano, Masami Terauchi
Publikováno v:
IOP Conference Series: Materials Science and Engineering. 891:012022
This paper discusses the path to the commercialization of a soft-X-ray emission spectrometer system for EPMA/SEM, its application, how it can be used to investigate new materials, and offers an update on improvements being investigated to further opt
Autor:
Satoshi Notoya, T. Murano, Hiroyuki Yamada, Peter McSwiggen, V. Robertson, Masaru Takakura, Hideyuki Takahashi
Publikováno v:
Microscopy and Microanalysis. 23:1018-1019
Autor:
Masaru Takakura
Publikováno v:
Journal of Japan Institute of Light Metals. 60:530-538
Autor:
Ayako Sato, John Critchell, Hideyuki Takahashi, Walter Knoll, Juergen Boerder, Norihisa Mori, Masaru Takakura
Publikováno v:
Microchimica Acta. 155:295-300
A novel specimen preparation method has been devised utilizing an Ar ion beam with a masking plate and an apparatus for this method has been developed for the preparation of good quality cross sections for high spatial resolution microscopy and micro
Autor:
Natasha Erdman, Takeshi Nokuo, Hideyuki Takahashi, Naoki Kikuchi, Yasuaki Yamamoto, Masaru Takakura, Hirobumi Morita, Hirohisa Yamada
Publikováno v:
Microscopy and Microanalysis. 22:640-641
Autor:
Masato Koike, Masaru Koeda, T. Murano, Takashi Imazono, Hiroyuki Sasai, Tetsuya Nagano, Hideyuki Takahashi, Masaru Takakura, Masami Terauchi
Publikováno v:
Microscopy & Microanalysis. 22(S3):414-415
A soft X-ray emission spectroscopy-based electron microscopy, SXES-SEM, instrument used in combination with a micro-channel plate (MCP) detector and CMOS camera has been applied for analyzing the electronic state of bulk specimens. To improve the ene