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pro vyhledávání: '"Masami Hanyu"'
Autor:
Masamichi Ido, Tatsuya Saito, Junichi Suzuki, Masanori Hayashikoshi, Junichi Yamashita, Masami Hanyu, Yukiyoshi Kiyota, Yasuhiro Nakashima
Publikováno v:
ISOCC
As the demand and production volume for embedded flash MCUs increase, their flash memory test time reduction is getting more important. Among them, trimming test occupies to a certain extent. To decrease it, a dedicated on-chip test circuit of a curr
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::b47e9dc2825836eedf04c00cc4b45967
https://doi.org/10.1109/isocc.2018.8649907
https://doi.org/10.1109/isocc.2018.8649907
