Zobrazeno 1 - 4
of 4
pro vyhledávání: '"Masaki Chikahisa"'
Publikováno v:
IEICE Transactions on Information and Systems. :1150-1160
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::9d74f9b263968148e4439a0d1f0c7394
https://doi.org/10.1587/transinf.2014fop0012
https://doi.org/10.1587/transinf.2014fop0012
Publikováno v:
Image and Vision Computing. 25:1117-1123
We propose an analytical estimation method of the electron probe profile from an SEM image through the wavelet analysis of the multiscale information for inline SEM inspection. Defocused electron probe profiles are calculated based on wave optical th
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::efdcd8805c0ddbc58a2e602b3d0d5ee3
https://doi.org/10.1016/j.imavis.2006.07.024
https://doi.org/10.1016/j.imavis.2006.07.024
Publikováno v:
WCRE
We herein propose Program-oriented Modeling (POM), a novel approach to extract software models automatically from source code. The proposed approach is developed in order to satisfy the requirements of model abstraction for situations in which a mode
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::6f169090ebda655973b3a0e3fb97ac06
https://doi.org/10.1109/wcre.2012.40
https://doi.org/10.1109/wcre.2012.40
Publikováno v:
Machine Vision Applications in Industrial Inspection XI.
We have tried to estimate the electron beam profile from a scanning electron microscope (SEM) image by using Wavelet multiresolution analysis for in-process SEM inspection. At first, an ideal secondary electron (SE) profile for step edge is calculate
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::bc40728b3259b3c58f81073024b567e0
https://doi.org/10.1117/12.474010
https://doi.org/10.1117/12.474010