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pro vyhledávání: '"Masaaki Someta"'
Autor:
Kosuke Kurushima, Azusa N. Hattori, Ken Hattori, Hiroshi Daimon, Hidekazu Tanaka, Yuji Otsuka, Masaaki Someta, Shohei Takemoto
Publikováno v:
Journal of Applied Crystallography. 52:732-744
New fitting analyses for peak shapes in a 2D reciprocal-space map are demonstrated to evaluate the strain, strain distribution and domain size of a crystalline ultra-thin (15 Å) film of β-FeSi2(100) grown epitaxially on an Si(001) substrate, using