Zobrazeno 1 - 10
of 30
pro vyhledávání: '"Masaaki Maeda"'
Method for recognizing operation statuses of metal cutting machine tools using spindle motor current
Publikováno v:
Nihon Kikai Gakkai ronbunshu, Vol 84, Iss 860, Pp 17-00432-17-00432 (2018)
Monitoring the operation status of machine tools using IoT is widely carried out in order to improve productivity. However, at manufacturing sites, a lot of legacy machines, which are old and lack the capability of sending data on their operation sta
Externí odkaz:
https://doaj.org/article/59ea6342a28641c3b3986352d0af4407
Method for recognizing operation statuses of metal cutting machine tools using spindle motor current
Publikováno v:
Transactions of the JSME (in Japanese). 84:17-00432
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c9422302d7e427bac85615bd23a362a8
https://doi.org/10.1299/transjsme.17-00432
https://doi.org/10.1299/transjsme.17-00432
Publikováno v:
Procedia CIRP. 63:418-423
Monitoring the operation status of machine tools using IoT is widely carried out in order to improve productivity. However, at manufacturing sites, a lot of legacy machines, which are old and lack the capability of sending data on their operation sta
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::7dddcf14a112184c90710de3678dd081
https://doi.org/10.1016/j.procir.2017.03.150
https://doi.org/10.1016/j.procir.2017.03.150
Publikováno v:
2015 International Conference on Electronic Packaging and iMAPS All Asia Conference (ICEP-IAAC).
In this paper, a mechanism of common mode noise generation in a full bridge converter is discussed, and a reduction method is proposed. Common mode noise is generated due to parasitic capacitors around power MOSFETs. In order to explain the mechanism
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a141c64db22cc029657b8a5d9062d9d8
https://doi.org/10.1109/icep-iaac.2015.7111100
https://doi.org/10.1109/icep-iaac.2015.7111100
Autor:
Masaaki MAEDA
Publikováno v:
Journal of the Japanese Society of Revegetation Technology. 30:541-545
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::db6ce62e8734ebf258868e4837d15ce6
https://doi.org/10.7211/jjsrt.30.541
https://doi.org/10.7211/jjsrt.30.541
Publikováno v:
The Proceedings of Mechanical Engineering Congress, Japan. 2018:S1440004
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::bdb428bb6f981949c7b312746adb7b6e
https://doi.org/10.1299/jsmemecj.2018.s1440004
https://doi.org/10.1299/jsmemecj.2018.s1440004
Publikováno v:
EMC Compo
Substrate noise coupling from digital circuits causes degradation of performance of analog circuits on the same LSI chip. Generally large area on the chip is necessary to reduce the substrate coupling. In this paper, a proposed method eliminates the
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::4142dd67528b39eb2b081b3d1a15e411
https://doi.org/10.1109/emccompo.2013.6735168
https://doi.org/10.1109/emccompo.2013.6735168
Publikováno v:
EMC Compo
Simultaneous switching current of a CMOS circuit causes power and ground bounces. The voltage fluctuation is injected into the CMOS substrate, and it degrades the performance of the circuit operation. In this report, we focus on the fact that parasit
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::7dada922a03120e6ed15e71b0f576151
https://doi.org/10.1109/emccompo.2013.6735187
https://doi.org/10.1109/emccompo.2013.6735187
Autor:
Sakurai Yuichi, Masaaki Maeda
Publikováno v:
The Proceedings of Mechanical Engineering Congress, Japan. 2016:S1410105
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::3b260adcb37eceb1657116c4fbf46608
https://doi.org/10.1299/jsmemecj.2016.s1410105
https://doi.org/10.1299/jsmemecj.2016.s1410105
Publikováno v:
The Proceedings of Conference of Chugoku-Shikoku Branch. :606-1
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::44d5b8287f9f0e1b3e45bbc374d9cd32
https://doi.org/10.1299/jsmecs.2014.52._606-1_
https://doi.org/10.1299/jsmecs.2014.52._606-1_