Zobrazeno 1 - 10
of 267
pro vyhledávání: '"Marvin Silver"'
Autor:
John Hernandez, Lawrence Slifkin
Publikováno v:
Physics Today. 47:77-78
Autor:
Hellmut Fritzsche, Howard M. Branz
Publikováno v:
Journal of Non-Crystalline Solids. 190:vii
Autor:
Gordon A. Thomas
Publikováno v:
Science. 187:640-641
Landmark contributions to science and mechanisms for the origin of the phenomena, and technology are rarely recognized at the time of reached important conclusions about the physical publication. Few people, even in technical areas, nature of the mat
Autor:
Waldman, Steven, Springen, Karen
Publikováno v:
Newsweek. 11/16/1992, Vol. 120 Issue 20, p80. 6p. 9 Color Photographs, 1 Chart, 1 Graph.
Publikováno v:
Journal of Non-Crystalline Solids. :599-602
We have studied the effect of photodegradation on the forward bias photo-gain in a-Si:H n-i-p devices. Annealed samples show both mono-molecular and bi-molecular recombination as a function of forward bias and light intensity. However, after degradat
Publikováno v:
Journal of Non-Crystalline Solids. :331-334
A model for steady-state and transient photoconductivity incorporating slow atomic relaxation effects for an electron trap is presented. Relaxation effects of this type were recently proposed to account for transient capacitance measurements in a-Si:
Publikováno v:
Journal of Non-Crystalline Solids. :595-598
The electroluminescence spectra and the carrier recombination lifetime distribution in a-Si:H devices have been measured in thin p-i-n, p-b-i-n and thick p-i-n devices in the annealed (A) and degraded (B) states. At room temperature and thin samples
Publikováno v:
Journal of Non-Crystalline Solids. :339-342
We present the transient forward bias current as a function of repetition rate and reverse bias between forward bias pulses in a-Si:H p-i-n devices which have thin or thick i-layers. Little repetition rate and reverse bias effects were found in thin
Publikováno v:
Journal of Applied Physics. 73:4567-4570
We have studied the forward bias current and electroluminescence (EL) in 0.4 μm a‐Si:H p‐i‐n and p‐b‐i‐n solar cells in the temperature range of 80 K≤T≤300 K. For comparison, the data in 2 μm p‐i‐n samples are shown. The forward