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pro vyhledávání: '"Marvin Sass"'
Autor:
Tuba Kiyan, Lars Renkes, Marvin Sass, Antonio Saavedra, Norbert Herfurth, Elham Amini, Jean-Pierre Seifert
Publikováno v:
Transactions on Cryptographic Hardware and Embedded Systems, Vol 2024, Iss 4 (2024)
There is an imminent trade-off between an Integrated Circuit (IC)’s testability and its physical security. While Design for Test (DfT) techniques, such as scan chains make the circuit’s physical behavior at runtime observable and easy to control,
Externí odkaz:
https://doaj.org/article/47417edce70d4f4bbc82155ec9730836
