Zobrazeno 1 - 2
of 2
pro vyhledávání: '"Marvin H. Zoellner"'
Publikováno v:
Sensors and Actuators A: Physical. 346:113823
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::950ba39a74c2c9cf4461aec9c23790ba
https://doi.org/10.1016/j.sna.2022.113823
https://doi.org/10.1016/j.sna.2022.113823
Autor:
Yujia Liu, Kevin-P. Gradwohl, Chen-Hsun Lu, Thilo Remmele, Yuji Yamamoto, Marvin H. Zoellner, Thomas Schroeder, Torsten Boeck, Houari Amari, Carsten Richter, Martin Albrecht
Publikováno v:
Journal of Applied Physics. 132:085302
We study the critical thickness for the plastic relaxation of the Si quantum well layer embedded in a SiGe/Si/SiGe heterostructure for qubits by plan-view transmission electron microscopy and electron channeling contrast imaging. Misfit dislocation s
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::35b6ebb629d4d9f384bfe297f0caaa95
https://doi.org/10.1063/5.0101753
https://doi.org/10.1063/5.0101753