Zobrazeno 1 - 3
of 3
pro vyhledávání: '"Martin Omaña"'
Publikováno v:
Microelectronics Reliability. 135:114594
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::136fe5484b7a330d31a876a90119745c
https://doi.org/10.1016/j.microrel.2022.114594
https://doi.org/10.1016/j.microrel.2022.114594
Publikováno v:
Microprocessors and Microsystems. 89:104437
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::bcd96af543181fd9053210684e4b4618
https://doi.org/10.1016/j.micpro.2022.104437
https://doi.org/10.1016/j.micpro.2022.104437
In this paper we analyze the probability that transient faults, multiple or single, affecting a checker of a self-checking circuit (with particular reference to the case of circuits using the two-rail code, the parity code, the Berger code and the Bo
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::072808142f0029550bdeba4bc0060223
http://hdl.handle.net/11585/70019
http://hdl.handle.net/11585/70019
