Zobrazeno 1 - 10
of 85
pro vyhledávání: '"Martin Neugebauer"'
Autor:
Andrea G. Forster, Martin Neugebauer
Publikováno v:
Sociological Science, Vol 11, Iss 32, Pp 886-906 (2024)
Factorial surveys (FSs) are increasingly used to predict real-world decisions. However, there is a paucity of research assessing whether these predictions are valid and, if so, under what conditions. In this preregistered study, we sent out N = 3, 00
Externí odkaz:
https://doaj.org/article/1bc4be62a3704bc7a133b3c1d62c2913
Publikováno v:
Light: Science & Applications, Vol 10, Iss 1, Pp 1-7 (2021)
An absolute characterization technique for microscope objectives is presented, working without a calibrated reference element. To achieve this, a reference wave is created by a sub-wavelength object.
Externí odkaz:
https://doaj.org/article/8a56b8823bff487f92db363e29c118e1
Autor:
Ankan Bag, Martin Neugebauer, Uwe Mick, Silke Christiansen, Sebastian A. Schulz, Peter Banzer
Publikováno v:
Nature Communications, Vol 11, Iss 1, Pp 1-7 (2020)
Integrated devices are useful for applications like sample stabilization, microscopy, adaptive optics, and acceleration sensors. Here the authors demonstrate a fully integrated chip-scale light-based displacement sensor using Huygens dipole scatterin
Externí odkaz:
https://doaj.org/article/c7fd4b43809141f9bbe3c81a303cd3dd
Publikováno v:
Nature Communications, Vol 7, Iss 1, Pp 1-6 (2016)
High-refractive-index nanoantennas support magnetic and electric resonances that can be excited with structured light. Here, the authors exploit the interference of such resonances to achieve strong lateral directionality of the emission and utilize
Externí odkaz:
https://doaj.org/article/dba9e10b5c4144d4b9fc22d78947feda
Publikováno v:
Physical Review Research, Vol 1, Iss 3, p 033143 (2019)
We investigate the evolution of transverse spin in tightly focused circularly polarized beams of light, where spin-orbit coupling causes a local rotation of the polarization ellipses upon propagation through the focal volume. The effect can be explai
Externí odkaz:
https://doaj.org/article/5cb1f46861744f15959f40ca2f7edacb
Publikováno v:
Physical Review X, Vol 8, Iss 2, p 021042 (2018)
When a beam of light is laterally confined, its field distribution can exhibit points where the local magnetic and electric field vectors spin in a plane containing the propagation direction of the electromagnetic wave. The phenomenon indicates the p
Externí odkaz:
https://doaj.org/article/d573afa9fe63429a9e72704bad5c14e7
Publikováno v:
ZeHf – Zeitschrift für empirische Hochschulforschung. 5:141-161
Studienaussteiger*innen entscheiden sich mehrheitlich für eine Berufsausbildung – doch wie sehen Ausbildungsbetriebe diese Bewerbungen? Der Beitrag untersucht anhand eines faktoriellen Surveys, in dem ein experimentelles Design mit klassischen Bef
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::794f1ca7a90a211e519be1ee48ec39cf
https://doi.org/10.3224/zehf.5i2.04
https://doi.org/10.3224/zehf.5i2.04
Publication specification of the international patent application WO 2022/171289 A1 (WO2022171289A1). https://patentscope.wipo.int/search/en/detail.jsf?docId=WO2022171289 The invention describes an absolute characterization method for focusing optica
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::0ad873703fdb11c1d1efd9b8574fc031
Autor:
Silke Christiansen, Uwe Mick, Ankan Bag, Sebastian A. Schulz, Martin Neugebauer, Peter Banzer
Publikováno v:
Nature Communications, Vol 11, Iss 1, Pp 1-7 (2020)
Nature Communications
Nature Communications
The field of optical metrology with its high precision position, rotation and wavefront sensors represents the basis for lithography and high resolution microscopy. However, the on-chip integration - a task highly relevant for future nanotechnologica
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::2dfe52d327988585faf36e68e6a5ba1f
https://doaj.org/article/c7fd4b43809141f9bbe3c81a303cd3dd
https://doaj.org/article/c7fd4b43809141f9bbe3c81a303cd3dd
Publikováno v:
Light, Science & Applications
Light: Science & Applications, Vol 10, Iss 1, Pp 1-7 (2021)
Light: Science & Applications, Vol 10, Iss 1, Pp 1-7 (2021)
Measuring the aberrations of optical systems is an essential step in the fabrication of high precision optical components. Such a characterization is usually based on comparing the device under investigation with a calibrated reference object. Howeve
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::1b161dcc95fefc8160b7c87fbacbe0e8
https://opus4.kobv.de/opus4-fau/files/22470/s41377-021-00663-x.pdf
https://opus4.kobv.de/opus4-fau/files/22470/s41377-021-00663-x.pdf