Zobrazeno 1 - 10
of 21
pro vyhledávání: '"Martin F. Fay"'
Publikováno v:
Optifab 2021.
Autor:
Palmatier, Matthew I.1,2 mip16@pitt.edu, Evans-Martin, F. Fay1, Hoffman, Alycia1, Caggiula, Anthony R.1, Chaudhri, Nadia2,3, Donny, Eric C.1, Xiu Liu1, Booth, Sherri1, Gharib, Maysa1, Craven, Laure1, Sved, Alan F.2
Publikováno v:
Psychopharmacology. Feb2006, Vol. 184 Issue 3/4, p391-400. 10p. 1 Chart, 3 Graphs.
Autor:
Martin F. Fay, Thomas Dresel
Publikováno v:
SPIE Proceedings.
Surface metrology must increasingly contend with sub-micron films, whose prevalence now extends to products well beyond semiconductor devices. For optical technologies such as coherence-scanning interferometry (CSI), transparent sub-micron films pose
Autor:
Martin F. Fay, Thomas Dresel
Publikováno v:
Optical Engineering. 56:111709
Surface metrology must increasingly contend with submicron films, whose prevalence now extends to products well beyond semiconductor devices. For optical technologies such as coherence-scanning interferometry (CSI), transparent submicron films pose a
Publikováno v:
SPIE Proceedings.
Optical 3D profilers based on Coherence Scanning Interferometry (CSI) provide high-resolution non-contact metrology for a broad range of applications. Capture of true color information together with 3D topography enables the detection of defects, ble
Publikováno v:
Classical Optics 2014.
Advances in the implementation of coherence scanning interferometry have dramatically extended the range of application for this well-known technique. New data acquisition and data processing methods significantly improve dynamic range, enabling meas