Zobrazeno 1 - 3
of 3
pro vyhledávání: '"Martin Burán"'
Autor:
Jozef Vincenc Oboňa, Lukáš Hladík, Martin Burán, Boris Arnold Rottwinkel, Michael Krause, Tomáš Borůvka, Rodrigo Delgadillo Blando, Scott Fuller
Publikováno v:
International Symposium for Testing and Failure Analysis.
This paper presents a large-volume workflow for fast failure analysis of microelectronic devices. The workflow incorporates a stand-alone ps-laser ablation tool and a FIB-SEM system. As implemented, the picosecond laser is used to quickly remove larg
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::9778c408985b55ef0fd40c71cd9480a2
https://doi.org/10.31399/asm.cp.istfa2021p0283
https://doi.org/10.31399/asm.cp.istfa2021p0283
Publikováno v:
International Symposium for Testing and Failure Analysis.
As the semiconductor industry demands higher throughput for failure analysis, there is a constant need to rapidly speed up the sample preparation workflows. Here we present extended capabilities of the standard Xe plasma Focused Ion Beam failure anal
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::8bf30c477314d120590a578953476815
https://doi.org/10.31399/asm.cp.istfa2020p0017
https://doi.org/10.31399/asm.cp.istfa2020p0017
Autor:
Věra Šlancarová
The present work represents the first comprehensive survey of medieval jewellery located in museum depositories, galleries and archaeological institutions of South Moravia. Into the collection, the author has included items from 79 localities: 45 urb
