Zobrazeno 1 - 10
of 17
pro vyhledávání: '"Martin Barke"'
Autor:
Martin Barke, Ulf Schlichtmann
Publikováno v:
ACM Journal on Emerging Technologies in Computing Systems. 12:1-22
The demands on system robustness and its immunity against perturbations are getting increasingly important. Nearly everybody has an intuitive understanding of what robustness means, but there is no proper way how to measure robustness of integrated c
Publikováno v:
Microelectronics Reliability. 54:1058-1065
Even though nearly everybody has an intuitive understanding of what robustness means and even though the demands on system durability and its immunity against perturbation are getting increasingly important, there is no proper way how to measure robu
Publikováno v:
Microelectronics Reliability. 54:1075-1082
Aging of integrated circuits can no longer be neglected in advanced process technologies. Especially the strong dependence of the delay degradation of digital circuits on the workload is still an unsolved problem. If the workload is not known exactly
Autor:
Doris Schmitt-Landsiedel, Veit B. Kleeberger, Martin Barke, Ulf Schlichtmann, Christoph Werner
Publikováno v:
Microelectronics Reliability. 54:1083-1089
We present an aging analysis which considers variations in chip environment and workload as they are caused by dynamic voltage or frequency scaling, power-down modes, etc. Therefore, we developed a model for NBTI degradation and recovery based on tra
Publikováno v:
Microelectronics Reliability. 52:1546-1552
Time-dependent variations have not received a lot of attention in the past. However, they gain in importance with each now process generation. Our goal is an accurate analysis of the timing degradation of large integrated circuits caused by aging eff
Autor:
Tamara Ehm, Julian Philipp, Martin Barkey, Martina Ober, Achim Theo Brinkop, David Simml, Miriam von Westphalen, Bert Nickel, Roy Beck, Joachim O. Rädler
Publikováno v:
Journal of Synchrotron Radiation, Vol 29, Iss 4, Pp 1014-1019 (2022)
3D printing changes the scope of how samples can be mounted for small-angle X-ray scattering (SAXS). In this paper a 3D-printed X-ray chamber, which allows for in situ exchange of buffer and in situ optical transmission spectroscopy, is presented. Th
Externí odkaz:
https://doaj.org/article/d4e6c7cd1daa4e0f966c11476ac1ace9
Autor:
Veit B. Kleeberger, Philipp H. Kindt, Ulf Schlichtmann, Alejandro Masrur, Martin Barke, Samarjit Chakraborty, Martin Becker
Publikováno v:
RTCSA
With the rapid progress in semiconductor technology and the shrinking of device geometries, the resulting processors are increasingly becoming prone to effects like aging and soft errors. As a processor ages, its electrical characteristics degrade, i
Autor:
Martin Radetzki, Ulf Schlichtmann, Markus Olbrich, Lars Hedrich, F. Salfelder, Weiyun Lu, Martin Barke, Michael Kargel
Publikováno v:
2012 4th Asia Symposium on Quality Electronic Design (ASQED).
Robust system design is becoming increasingly important, because of the ongoing miniaturization of integrated circuits, the increasing effects of aging mechanisms, and the effects of parasitic elements, both intrinsic and external. For safety reasons
Publikováno v:
2010 IEEE/ACM International Conference on Computer-Aided Design (ICCAD).