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Autor:
Atul Chabbra, Anil K. Malik, Jeff Zimmerman, Robert C. Redburn, Nicholai L' Esperance, Adisun Wheelock, Sameer Chillarige, Bharath Nandakumar, Martin Amodeo
Publikováno v:
2020 IEEE International Test Conference India.
Numerous areas of VLSI Design and Automation including test and diagnosis have already started benefiting from machine learning based approaches. In this paper, we focus on application of machine learning techniques in the context of Volume Diagnosis