Zobrazeno 1 - 10
of 10
pro vyhledávání: '"Martin, Čalkovský"'
Autor:
Martin Čalkovský, Erich A. Müller, Dagmar Gerthsen, Alexander Colsmann, Yonghe Li, Christian Sprau
Publikováno v:
ACS Applied Materials & Interfaces. 13:53252-53261
The distinction of different organic materials in phase mixtures is hampered in electron microscopy because electron scattering does not strongly differ in carbon-based materials that mainly consist of light elements. A successful strategy for contra
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::d4c8392e90a43bcbf80076177b93086d
https://doi.org/10.1021/acsami.1c16728
https://doi.org/10.1021/acsami.1c16728
Autor:
Dagmar Gerthsen, Martin Čalkovský, Erich A. Müller, Yonghe Li, Christian Sprau, Alexander Colsmann
Publikováno v:
Microscopy and Microanalysis. 27:1922-1925
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::fea7b0a97e92b88d310c560d13d3f8b5
https://doi.org/10.1017/s1431927621006991
https://doi.org/10.1017/s1431927621006991
Autor:
Nadejda Firman, Martin Čalkovský, Matthias Meffert, Erich Müller, Martin Wegener, Frederik Mayer, Dagmar Gerthsen
Publikováno v:
Microscopy and Microanalysis. 27:778-781
Focused-ion-beam/scanning-electron-microscopy (FIB-SEM) tomography has become increasingly important to investigate the three-dimensional (3D) distribution of different phases in inhomogeneous materials. However, quantitative analysis of 3D structure
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::5ce340472dec0db5553b0eb2763d5581
https://doi.org/10.1017/s143192762100310x
https://doi.org/10.1017/s143192762100310x
Publikováno v:
Journal of Microscopy, 289 (1), 32-47
Backscattered-electron scanning electron microscopy (BSE-SEM) imaging is a valuable technique for materials characterisation because it provides information about the homogeneity of the material in the analysed specimen and is therefore an important
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::696d069d3f0473d52b202366de329d00
https://pubmed.ncbi.nlm.nih.gov/36245312
https://pubmed.ncbi.nlm.nih.gov/36245312
Autor:
Igor, Sokolović, Michele, Reticcioli, Martin, Čalkovský, Margareta, Wagner, Michael, Schmid, Cesare, Franchini, Ulrike, Diebold, Martin, Setvín
Publikováno v:
Proc Natl Acad Sci U S A
Interaction of molecular oxygen with semiconducting oxide surfaces plays a key role in many technologies. The topic is difficult to approach both by experiment and in theory, mainly due to multiple stable charge states, adsorption configurations, and
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=pmid________::fc1a33c5dc3d2ec9bc8d737e3981f1e8
https://pubmed.ncbi.nlm.nih.gov/32527857
https://pubmed.ncbi.nlm.nih.gov/32527857
Autor:
Pavel A. Levkin, Andreas Niemeyer, Rasmus R. Schröder, Zhe-Qin Dong, Martin Čalkovský, Daniel Ryklin, Irene Wacker, Frederik Mayer, Dagmar Gerthsen, Martin Wegener, Ronald Curticean
Publikováno v:
Advanced materials, 32 (32), Art. Nr.: 2002044
A photoresist system for 3D two���photon microprinting is presented, which enables the printing of inherently nanoporous structures with mean pore sizes around 50 nm by means of self���organization on the nanoscale. A phase separation bet
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::a552c9b9b4c37450b4e5cf0b06968fd6
https://publikationen.bibliothek.kit.edu/1000122747/86219559
https://publikationen.bibliothek.kit.edu/1000122747/86219559
Publikováno v:
Ultramicroscopy. 207
For quantitative electron microscopy the comparison of measured and simulated data is essential. Monte Carlo (MC) simulations are well established to calculate the high-angle annular dark-field scanning transmission electron microscopy (HAADF-STEM) i
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::9e180850c146a033cd62fd0265184d3a
https://pubmed.ncbi.nlm.nih.gov/31546129
https://pubmed.ncbi.nlm.nih.gov/31546129
Publikováno v:
Microscopy and Microanalysis. 25:464-465
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::778644971071fa51cec66d574b16c90b
https://doi.org/10.1017/s1431927619003052
https://doi.org/10.1017/s1431927619003052
Autor:
Čalkovský, Martin1,2 (AUTHOR) martin.calkovsky@kit.edu, Müller, Erich2 (AUTHOR), Gerthsen, Dagmar1,2 (AUTHOR)
Publikováno v:
Journal of Microscopy. Jan2023, Vol. 289 Issue 1, p32-47. 16p.
Autor:
Mayer, Frederik, Ryklin, Daniel, Wacker, Irene, Curticean, Ronald, Čalkovský, Martin, Niemeyer, Andreas, Dong, Zheqin, Levkin, Pavel A., Gerthsen, Dagmar, Schröder, Rasmus R., Wegener, Martin
Publikováno v:
Advanced Materials; 8/22/2020, Vol. 32 Issue 32, p1-7, 7p