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pro vyhledávání: '"Martikainen, Elvira"'
Publikováno v:
Martikainen, E, Vaskuri, A, Dönsberg, T & Ikonen, E 2020, ' Cryostat setup for measuring spectral and electrical properties of light-emitting diodes at junction temperatures from 81 K to 297 K ', Review of Scientific Instruments, vol. 91, no. 1, 015106 . https://doi.org/10.1063/1.5125319
We introduce a cryostat setup for measuring fundamental optical and electrical properties of light-emitting diodes (LEDs). With the setup, the cryostat pressure and the LED properties of the forward voltage, junction temperature, and electroluminesce
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::40009a6d16fb60c7327e234c17088f51
https://aaltodoc.aalto.fi/handle/123456789/42877
https://aaltodoc.aalto.fi/handle/123456789/42877
Autor:
Martikainen E; Metrology Research Institute, Aalto University, P.O. Box 15500, 00076 Aalto, Finland., Vaskuri A; Metrology Research Institute, Aalto University, P.O. Box 15500, 00076 Aalto, Finland., Dönsberg T; Metrology Research Institute, Aalto University, P.O. Box 15500, 00076 Aalto, Finland., Ikonen E; Metrology Research Institute, Aalto University, P.O. Box 15500, 00076 Aalto, Finland.
Publikováno v:
The Review of scientific instruments [Rev Sci Instrum] 2020 Jan 01; Vol. 91 (1), pp. 015106.