Zobrazeno 1 - 10
of 14
pro vyhledávání: '"Martha K. Small"'
Autor:
Lori Callaghan, Gerald Ong, Jackie Tan, Steve Ortiz, Rich Ruby, Reed Parker, Stephen R. Gilbert, Frank Bi, Choon Chowe Chen, Martha K. Small, Lexie Kekoa, Norashaz Bin Alias
Publikováno v:
2014 IEEE International Ultrasonics Symposium.
We present a robust, chip-scale packaged FBAR oscillator that is compatible with high volume manufacturing. The oscillator's extremely small size (area < 1 mm2, thickness = 0.23 mm) combined with an SMT-compatible pad design enables integration of th
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::32250c99560d77cf4c414706da44927c
https://doi.org/10.1109/ultsym.2014.0023
https://doi.org/10.1109/ultsym.2014.0023
Autor:
Reed Parker, Stephen R. Gilbert, Lori Callaghan, Julie E. Fouquet, Martha K. Small, Suresh Sridaran, Rich Ruby, Steve Ortiz, Frank Bi
Publikováno v:
2014 IEEE International Ultrasonics Symposium.
We present a FBAR oscillator that operates at 628MHz, achieves low jitter
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::21739b499c011247d28d4c7a72b03510
https://doi.org/10.1109/ultsym.2014.0022
https://doi.org/10.1109/ultsym.2014.0022
Autor:
Steve Ortiz, L. Callaghan, Martha K. Small, Frank Bi, Reed Parker, Stephen R. Gilbert, Richard C. Ruby, Fan Zhang
Publikováno v:
2013 Joint European Frequency and Time Forum & International Frequency Control Symposium (EFTF/IFC).
We present a fourth-design generation Free Running Oscillator and Voltage Controlled Oscillator using integrated bipolar circuitry in the lid wafer with a temperature-compensated FBAR resonator in the base wafer. The goal is to produce a high frequen
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::03827b77581fda94c5b04d81d68d6a9b
https://doi.org/10.1109/eftf-ifc.2013.6702123
https://doi.org/10.1109/eftf-ifc.2013.6702123
Publikováno v:
Journal of Materials Research. 9:25-30
Analysis and sample preparation techniques for the bulge test have been improved to the point where the test can provide reliable and accurate measurements of the mechanical properties of thin films. Ag-Pd multilayer films of variable bilayer period
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::8e95dfbb2580718d12c668bbc344faa2
https://doi.org/10.1557/jmr.1994.0025
https://doi.org/10.1557/jmr.1994.0025
Publikováno v:
2011 IEEE International Ultrasonics Symposium.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::eca50515ffb101432842204a2c686f52
https://doi.org/10.1109/ultsym.2011.0302
https://doi.org/10.1109/ultsym.2011.0302
Publikováno v:
2011 Joint Conference of the IEEE International Frequency Control and the European Frequency and Time Forum (FCS) Proceedings.
Recent advances in temperature-compensation for FBAR (Film Bulk Acoustic Resonators) have brought this technology forward as a serious contender in the oscillator marketplace. As with any mechanical resonator oscillator, a cost-effective hermetic pac
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::8de16b60fa56f8dc257e581ef52fdd34
https://doi.org/10.1109/fcs.2011.5977848
https://doi.org/10.1109/fcs.2011.5977848
Autor:
Donald Lee, Richard C. Ruby, Steve Ortiz, Qiang Zou, Martha K. Small, Frank Bi, Yury Oshmyansky, Jyrki Kaitila
Publikováno v:
2010 IEEE International Frequency Control Symposium.
This paper demonstrates two variations of Temperature compensated (TempCo) FBAR resonators with high Kt2. One 1.5 GHz non-symmetric stack design TempCo FBAR resonator has a Kt2 of 4.28% and linear TCF of 0 ppm/°C. A second, quasi-symmetric stack des
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::52c73666b68fa49af3b848f01afb0e0a
https://doi.org/10.1109/freq.2010.5556250
https://doi.org/10.1109/freq.2010.5556250
Autor:
William D. Nix, Martha K. Small
Publikováno v:
Journal of Materials Research. 7:1553-1563
Since its first application to thin films in the 1950's the bulge test has become a standard technique for measuring thin film mechanical properties. While the apparatus required for the test is simple, interpretation of the data is not. Failure to r
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::46ce8ee699ffa1de65f22055ce8864f9
https://doi.org/10.1557/jmr.1992.1553
https://doi.org/10.1557/jmr.1992.1553
Autor:
William D. Nix, Martha K. Small
Publikováno v:
MRS Proceedings. 343
The elastic biaxial modulus of a polycrystalline material as a function of [111] fiber texture was determined by imposing an equibiaxial strain and calculating the resulting stress assuming a plane-stress condition. The situation of a such a texture
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a5c2502a796e285f396ad05d53f91cf8
https://doi.org/10.1557/proc-343-561
https://doi.org/10.1557/proc-343-561
Publikováno v:
MRS Proceedings. 308
In this paper we address possible causes for inconsistencies in bulge test results and describe methods by which the bulge test technique can be made to produce accurate and reliable results. Experiments have been conducted on a variety of materials:
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f9a23fa71d1191682a7ddf2dbcce903a
https://doi.org/10.1557/proc-308-159
https://doi.org/10.1557/proc-308-159