Zobrazeno 1 - 7
of 7
pro vyhledávání: '"Marten Patt"'
Autor:
Vitaliy Feyer, M. Escher, Nicholas Barrett, I. P. Krug, M. Merkel, C. Wiemann, N. Weber, O. Renault, Marten Patt, Christian Schneider, Lukasz Plucinski
Publikováno v:
Journal of electron spectroscopy and related phenomena 185, 330-339 (2012). doi:10.1016/j.elspec.2012.08.003
The analysis of chemical and electronic states in complex and nanostructured material systems requires electron spectroscopy to be carried out with nanometer lateral resolution, i.e. nanospectroscopy. This goal can be achieved by combining a parallel
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::a92585baaf158f10c396f8b53092ffa0
https://doi.org/10.1016/j.elspec.2012.08.003
https://doi.org/10.1016/j.elspec.2012.08.003
Autor:
Claus M. Schneider, Marten Patt, Annemarie Koehl, Regina Dittmann, Rainer Waser, Christian Lenser, Hongchu Du, Ivetta Slipukhina, Marjana Lezaic, Vitaliy Feyer
Publikováno v:
Advanced functional materials 25(40), 6360-6368 (2015). doi:10.1002/adfm.201500851
The resistance switching phenomenon in many transition metal oxides is described by ion motion leading to the formation of oxygen-deficient, highly electron-doped filaments. In this paper, the interface and subinterface region of electroformed and sw
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::c335221daf00679d917e9ad9689d5974
https://bib-pubdb1.desy.de/record/288919
https://bib-pubdb1.desy.de/record/288919
Autor:
Marten Patt, Regina Dittmann, Christian Lenser, Claus M. Schneider, Annemarie Köhl, Rainer Waser
Publikováno v:
Physical review / B 90(11), 115312 (2014). doi:10.1103/PhysRevB.90.115312
The electronic structure and band alignment at metal/oxide interfaces for nonvolatile memory applications are investigated by hard x-ray photoelectron spectroscopy (HAXPES) and DC transport measurements, using acceptor doped SrTiO3 as a model memrist
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::8dda7bd1c57d76651bc2f769e181ad17
https://www.scopus.com/inward/record.url?partnerID=HzOxMe3b&origin=inward&scp=84907459461
https://www.scopus.com/inward/record.url?partnerID=HzOxMe3b&origin=inward&scp=84907459461
Autor:
Regina Dittmann, Annemarie Köhl, Rainer Waser, Marten Patt, Claus M. Schneider, Christian Lenser, Stephan Menzel, C. Wiemann
The nanoscale electro-reduction in a memristive oxide is a highly relevant field for future non-volatile memory materials. Photoemission electron microscopy is used to identify the conducting filaments and correlate them to structural features of the
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::9064e50993d0c8b2834163afb5d835dc
Autor:
M. Escher, Stefan Cramm, W. Drube, M. Merkel, Claus M. Schneider, C. Wiemann, Andrei Gloskovskii, Sebastian Thiess, Marten Patt
Publikováno v:
Applied physics letters 100, 223106 (2012). doi:10.1063/1.4722940
We report about a proof-of-principle experiment which explores the perspectives of performing hard x-ray photoemission spectromicroscopy with high lateral resolution. Our results obtained with an energy-filtered photoemission microscope at the PETRA
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::7e66e9f953598a158b6d6660a40fe371
https://www.scopus.com/inward/record.url?partnerID=HzOxMe3b&origin=inward&scp=84862139431
https://www.scopus.com/inward/record.url?partnerID=HzOxMe3b&origin=inward&scp=84862139431
We describe first experiences with a novel spectromicroscopy set-up — NanoESCA@Elettra — which has been installed at the nanospectroscopy soft x-ray beamline at Elettra (Trieste). The system features an energy-filtered photoemission microscope wi
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::41514576f4e512977964d1cf19b7d1cd
https://www.scopus.com/inward/record.url?partnerID=HzOxMe3b&origin=inward&scp=80055020949
https://www.scopus.com/inward/record.url?partnerID=HzOxMe3b&origin=inward&scp=80055020949
Autor:
C. Wiemann, Marten Patt, M. Escher, Nils Weber, Andrei Gloskovskii, W. Drube, Claus M. Schneider, M. Merkel
Publikováno v:
Review of scientific instruments 85(11), 113704 (2014). doi:10.1063/1.4902141
Hard x-ray photoelectron spectroscopy (HAXPES) has now matured into a well-established technique as a bulk sensitive probe of the electronic structure due to the larger escape depth of the highly energetic electrons. In order to enable HAXPES studies
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::683ccdb63aa2e2c5cfea9ebf4a476ebe
https://doi.org/10.1063/1.4902141
https://doi.org/10.1063/1.4902141