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of 5
pro vyhledávání: '"Martínez, Juan Francisco González"'
Scanning Probe Microscopy allows for extreme resolution down to the atomic scale. Unfortunately, total scanning range is rather limited, therefore finding a specific position on the sample is tedious. This is an important limitation of many Scanning
Externí odkaz:
http://arxiv.org/abs/1211.2275
A method to precisely calibrate the oscillation amplitude in Dynamic Scanning Force Microscopy is described. It is experimentally shown that a typical electronics used to process the dynamic motion of the cantilever can be adjusted to transfer the th
Externí odkaz:
http://arxiv.org/abs/1205.0892
In the present work we show that the correct determination of surface morphology using Scanning Force Microscopy (SFM) imaging and Power Spectral Density (PSD) analysis of the surface roughness is an extremely demanding task that is easily affected b
Externí odkaz:
http://arxiv.org/abs/1104.4819
Autor:
Arteche‐López, Ana, Avila‐Fernandez, Almudena, Damian, Alejandra, Soengas‐Gonda, Emma, de la Fuente, Rubén Pérez, Gómez, Patricia Ramos, Merlo, Jesús Gallego, Burgos, Laura Horcajada, Fernández, Carlos Cemillán, Rosales, Jose Miguel Lezana, Martínez, Juan Francisco González, Quesada‐Espinosa, Juan Francisco, Corton, Marta, Guerrero‐Molina, Maria Paz
Publikováno v:
Clinical Genetics; Feb2023, Vol. 103 Issue 2, p236-241, 6p
Autor:
Martínez JF; Instituto Universitario de Investigación en Óptica y Nanofísica, Campus de Espinardo, Universidad de Murcia, E-30100 Murcia, Spain. jfgm@um.es, Nieto-Carvajal I, Colchero J
Publikováno v:
Nanotechnology [Nanotechnology] 2013 May 10; Vol. 24 (18), pp. 185701. Date of Electronic Publication: 2013 Apr 10.