Zobrazeno 1 - 10
of 182
pro vyhledávání: '"Marshal A. Miller"'
Publikováno v:
The Journal of family practice. 66(2)
Bullying has significant health implications for young people and society at large. These screening tools, tips for responding to bullies, and Web resources can help.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=pmid________::f79465ada785e681be56a20b2c2c7106
https://pubmed.ncbi.nlm.nih.gov/28375392
https://pubmed.ncbi.nlm.nih.gov/28375392
Autor:
Jeremy Close, Marshal N. Miller
Publikováno v:
Sports Health: A Multidisciplinary Approach. 7:421-423
Dancers frequently present to the sports medicine clinic with a variety of lower extremity complaints ranging from acute and traumatic injuries to more chronic, overuse injuries. This case series depicts a similar and unique incidental radiographic f
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::b87e529266066411ce1e090841b8ab62
https://doi.org/10.1177/1941738115578604
https://doi.org/10.1177/1941738115578604
Autor:
Nicholas, Shungu, Marshal N, Miller, Geoffrey, Mills, Neesha, Patel, Amanda, de la Paz, Victoria, Rose, Jill, Kropa, Rina, Edi, Emily, Levy, Margaret, Crenshaw, Chris, Hwang
Publikováno v:
Family medicine. 47(10)
Physicians frequently fail to document obesity and obesity-related counseling. We sought to determine whether attaching a physical reminder card to patient encounter forms would increase electronic medical record (EMR) assessment of and documentation
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=pmid________::ec8f10b6562fde7fdec3672b85e95f9c
https://pubmed.ncbi.nlm.nih.gov/26545056
https://pubmed.ncbi.nlm.nih.gov/26545056
Publikováno v:
SPIE Proceedings.
Continued improvements in SEM contour extraction capabilities have enabled calibrating more accurate OPC models for advanced technology nodes using a hybrid approach, combining CDs for 1D structures and full contour measurements for more complex 2D p
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ad25f49ea1e87701a30e8012456c2613
https://doi.org/10.1117/12.2176406
https://doi.org/10.1117/12.2176406
Autor:
Shunsuke Koshihara, Shoji Hotta, Ioana Graur, Toru Ishimoto, Derren N. Dunn, Marshal N. Miller, Nobuhiro Okai, Scott Halle, A. Yamaguchi, Yutaka Hojo, Keiichiro Hitomi, Nicole Saulnier, Hitoshi Komuro
Publikováno v:
SPIE Proceedings.
Hybrid OPC modeling is investigated using both CDs from 1D and simple 2D structures and contours extracted from complex 2D structures, which are obtained by a Critical Dimension-Scanning Electron Microscope (CD-SEM). Recent studies have addressed som
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::96048142f54544b259f8fe5746293221
https://doi.org/10.1117/12.2047678
https://doi.org/10.1117/12.2047678
Autor:
Ioana Graur, Hitoshi Komuro, Yutaka Hojo, Derren N. Dunn, Marshal N. Miller, Atuko Yamaguchi, Keiichiro Hitomi, Toru Ishimoto, Shoji Hotta, Nicole Saulnier, Shunsuke Koshihara, Scott Halle, Nobuhiro Okai
Publikováno v:
Journal of Micro/Nanolithography, MEMS, and MOEMS. 15:034002
The model accuracy of optical proximity-effect correction (OPC) was investigated by two modeling methods for a 10-nm node process. The first method is to use contours of two-dimensional structures extracted from critical dimension-scanning electron m
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1fbc877661149f00aa1a2c43a0e7acc1
https://doi.org/10.1117/1.jmm.15.3.034002
https://doi.org/10.1117/1.jmm.15.3.034002
Autor:
Abde Kaqalwalla, Nuo Xu, Lynn T.-N. Wang, Puneet Gupta, Costas J. Spanos, Tiehui Liu, Tuck-Boon Chan, Kwangok Jeong, Kameshwar Poolla, Kenji Yamazoe, Anand Subramanian, Xin Sun, Justin Ghan, Marshal A. Miller, Andrew R. Neureuther, Kun Qian, Eric Y. Chin, Cooper S. Levy, Rani S. Ghaida, Juliet Rubinstein
Publikováno v:
SPIE Proceedings.
Techniques for identifying and mitigating effects of process variation on the electrical performance of integrated circuits are described. These results are from multi-discipline, collaborative university-industry research and emphasize anticipating
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::81967e29b61c1e8cd2b8d48d38b7bffa
https://doi.org/10.1117/12.899394
https://doi.org/10.1117/12.899394
Publikováno v:
Journal of palliative medicine. 13(10)
High symptom burden and hospital mortality among patients with lung cancer argues for early palliative care intervention. Patient characteristics and discharge dispositions in hospitalized patients with lung cancer receiving usual care were compared
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::d60a0932daf2d136b9596e973edf22e2
https://pubmed.ncbi.nlm.nih.gov/20879874
https://pubmed.ncbi.nlm.nih.gov/20879874
Publikováno v:
SPIE Proceedings.
This paper presents kernel convolution with pattern matching (KCPM), which is an updated version of fast-CADpattern matching for assessing lithography process variations. With KCPM, kernels that capture lateral featureinteraction between features due
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ce881eb84a2268eecd2393934c7cda18
https://doi.org/10.1117/12.846630
https://doi.org/10.1117/12.846630
Publikováno v:
SPIE Proceedings.
In lithography for the 45nm node and beyond, phase errors introduced through electromagnetic field (EMF) effects at photomask openings are significant sources of error in calculating on-wafer images. These edge effects create distortion in both real
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::53da26c64464c71998d97c966901039e
https://doi.org/10.1117/12.829657
https://doi.org/10.1117/12.829657