Zobrazeno 1 - 10
of 37
pro vyhledávání: '"Markus Zeier"'
Publikováno v:
CHIMIA, Vol 76, Iss 6 (2022)
Externí odkaz:
https://doaj.org/article/8c6e8ac22d1c442b8e3057d277c8a2ed
Autor:
Gregor Boschung, Michael Wollensack, Markus Zeier, Cédric Blaser, Christian Hof, Manuel Stathis, Peter Blattner, Florian Stuker, Nina Basic, Federico Grasso Toro
Publikováno v:
Measurement: Sensors, Vol 18, Iss , Pp 100282- (2021)
The digitalization of metrology poses a challenge to all members of the metrology community. We propose an approach for digital calibration certificates (DCCs) based on a PDF/A-3 solution that could be a stepping-stone towards the digitalization of m
Externí odkaz:
https://doaj.org/article/932a8806a8894ccaa836cbe4b58288ef
Autor:
Djamel Allal, Johannes Hoffmann, Martin Hudlicka, J. Rufenacht, Daniel Stalder, Markus Zeier, Michael Wollensack, Alireza Kazemipour, Gregory Gaumann
Publikováno v:
IEEE Transactions on Instrumentation and Measurement. 70:1-10
Measuring the material parameters with a vector network analyzer (VNA) usually requires time-domain gating and complicated free-space calibrations. At terahertz frequencies, classic calibrations become more problematic and uncertainty calculation for
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::3a025c543771f470604b911e8f6b3b58
https://doi.org/10.1109/tim.2021.3077660
https://doi.org/10.1109/tim.2021.3077660
Autor:
J. Rufenacht, Johannes Hoffmann, Markus Zeier, See Khee Yee, Alireza Kazemipour, Michael Wollensack, Martin Hudlicka, Daniel Stalder, Gregory Gaumann
Publikováno v:
Journal of Infrared, Millimeter, and Terahertz Waves. 41:1199-1217
Material parameter extraction algorithms are studied and simplified both for transmission-reflection and transmission-only methods. The simplified relations, which are closed-form in some cases, are analyzed to establish the uncertainty sensitivity c
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::eca3dcb52f9a5231026c1af71a9a40dc
https://doi.org/10.1007/s10762-020-00723-0
https://doi.org/10.1007/s10762-020-00723-0
Autor:
Federico Grasso Toro, Peter Blattner, Gregor Boschung, Michael Wollensack, Manuel Stathis, Nina Basic, Cédric Blaser, Florian Stuker, Christian Hof, Markus Zeier
Publikováno v:
Measurement: Sensors, Vol 18, Iss, Pp 100282-(2021)
The digitalization of metrology poses a challenge to all members of the metrology community. We propose an approach for digital calibration certificates (DCCs) based on a PDF/A-3 solution that could be a stepping-stone towards the digitalization of m
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::eadee493461e635e3a8483b2d1d3b512
http://www.sciencedirect.com/science/article/pii/S2665917421002452
http://www.sciencedirect.com/science/article/pii/S2665917421002452
Autor:
Johannes Hoffmann, Juerg Ruefenacht, Toai le Quang, Denis Vasyukov, Peter Huerlimann, Markus Zeier, Michael Wollensack
Publikováno v:
2020 Conference on Precision Electromagnetic Measurements (CPEM).
Calibration of Vector Network Analyzers is usually limited to the frequency range of 100 MHz to several hundred GHz. Typical DC and LF techniques like Josephson voltage standards and quantum hall standards and associated bridges are limited up to app
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c1845628f90a41995939a65d5eb30cfa
https://doi.org/10.1109/cpem49742.2020.9191850
https://doi.org/10.1109/cpem49742.2020.9191850
Autor:
Alireza Kazemipour, Johannes Hoffmann, Markus Zeier, Juerg Ruefenacht, Daniel Stalder, Michael Wollensack, Martin Hudlicka, Djamel Allal
Publikováno v:
2020 Conference on Precision Electromagnetic Measurements (CPEM).
A method is presented to measure materials and extract the complex permittivity without using classic VNA calibrations and time-gating. It is based on normalization to a "Thru" connection and analyzing error-terms and multiple-reflection phenomena. M
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::d5984f45d909082560191b0c9e4fa1d5
https://doi.org/10.1109/cpem49742.2020.9191818
https://doi.org/10.1109/cpem49742.2020.9191818
This article presents our results in fabrication and measurement of inductive devices for scanning microwave microscopy (SMM). Devices with resistance and inductance varying between 9\,$\Omega$-220\,$\Omega$ and up to 200\,pH were produced on SiN mem
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::ccd499f066c611dadec86bbd67d401ff
https://zenodo.org/record/4275929
https://zenodo.org/record/4275929
Electromagnetic characterization of materials is the key parameter for space applications, imaging, and, the high-speed electronics and telecommunications industries. In fact, "a priori" knowledge of different materials' permittivity and permeability
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::04518ac30086b3a2e259951605c4388d
Autor:
Alireza Kazemipour, Gregory Gaumann, Martin Hudlicka, Michael Wollensack, Juerg Rufenacht, Markus Zeier, Johannes Hoffmann, See Khee Yee
Classic equations for material parameter extraction are reconsidered and slightly modified to achieve stable results at all frequencies. Meanwhile, closed-form solutions are developed to simplify the material parameter extraction process and uncertai
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::05847f977993b601936e177be30c4d56