Zobrazeno 1 - 4
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pro vyhledávání: '"Mark W. Poulter"'
Autor:
Stephen G. Davies, T. Richardson, James F. Costello, G.G. Roberts, Rona M. Highcock, Mario E. C. Polywka, Mark W. Poulter
Publikováno v:
Journal of the Chemical Society, Dalton Transactions. :105-110
A two-dimensional model for the structure of films fabricated from organoruthenium amphiphiles of the type [Ru(η 5 -C 5 H 5 )(PPh 2 R) 2 (p-NCC 6 H 4 OR′)]PF 6 (R = Ph, p-tolyl or p-biphenyl; R′ = Et or C 16 H 33 ) at the air–water interface h
Publikováno v:
2010 IEEE International Integrated Reliability Workshop Final Report.
The equation of resistance drift governing oxidation is derived in this paper for Copper-Top (Cu-Top) interconnects to assess reliability of Cu-Top. Our equation is not only demonstrated by thermal storage tests at various temperatures but also chara
Autor:
Mark W. Poulter, W. Vigrass
Publikováno v:
1997 IEEE International Integrated Reliability Workshop Final Report (Cat. No.97TH8319).
Autor:
D. Brisbin, Mark W. Poulter
Publikováno v:
IEEE 1995 International Integrated Reliability Workshop. Final Report.
Summary form only given. WLR can play a key role in process development. Reliability issues can be identified and fixed early in the development process. The WLR fast test self heated gate structure is ideally suited for monitoring and characterizing