Zobrazeno 1 - 2
of 2
pro vyhledávání: '"Mark W. Michael"'
Autor:
Raymond T. Lee, Jon D. Cheek, Michael Duane, John L. Nistler, Robert Dawson, Jim Fulford, Dirk J Wristers, Chuck May, Fred N. Hause, Daniel Kadoch, Bernard W. K. Ho, Brad T. Moore, Mark W. Michael, Ming-Yin Hao, Deepak K. Nayak, Bijnan Bandyopadhyay, Mark I. Gardner
Publikováno v:
SPIE Proceedings.
A family of CMOS processing technologies used to produce AMDs fifth and sixth generation microprocessors (K5 and K6) is described. Some of the issues that arose during the technology development and the transfer to manufacturing are also presented. T
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a85645c7e3d255bfe19781be971fa6b4
https://doi.org/10.1117/12.284617
https://doi.org/10.1117/12.284617
Autor:
Stuart E. Brown, Karen L. Turnquest, Doug Downey, Richard D. Edwards, Mark W. Michael, Paul W. Ackmann, John L. Nistler
Publikováno v:
SPIE Proceedings.
As the device performance requirements tighten to improve speed distributions, the speed binning caused by across the wafer critical dimension (CD) variation will have significant impact on manufacturing performance yields. Overall speed performance
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::83a757b1f05ae74277f4969636a2979a
https://doi.org/10.1117/12.275998
https://doi.org/10.1117/12.275998