Zobrazeno 1 - 10
of 17
pro vyhledávání: '"Mark Oksman"'
Autor:
Mark Oksman, Doron Naveh, Lothar Houben, Shmuel Grinvald, Moshe Kirshner, Ofer Sinai, Chen Stern, Maya Bar-Sadan, Hadas Alon, Oren E. Meiron
Publikováno v:
Scientific Reports
Scientific Reports, Vol 8, Iss 1, Pp 1-7 (2018)
Scientific Reports, Vol 8, Iss 1, Pp 1-7 (2018)
Thin films of layered semiconductors emerge as highly promising materials for energy harvesting and storage, optoelectronics and catalysis. Their natural propensity to grow as oriented crystals and films is one of their distinct properties under rece
Autor:
Mark Oksman, Moshe Katzman, Avinoam Zadok, Yuri Kaganovskii, Dvir Munk, Mirit Hen, Michael Rosenbluh, Arik Bergman
Publikováno v:
Integrated Optics: Devices, Materials, and Technologies XXII.
Chalcogenide glasses (ChGs) exhibit high refractive indices, broad transparency windows, pronounced nonlinearities, and photo-sensitivity effects. Waveguides are fabricated in ChGs layers using dry etching, nano-imprint lithography, or direct laser-b
Autor:
Michael Rosenbluh, Mark Oksman, Moshe Katzman, Avi Zadok, Arik Bergman, Mirit Hen, Yuri Kaganovskii, Dvir Munk
Publikováno v:
Conference on Lasers and Electro-Optics.
Highly nonlinear waveguides are fabricated through deposition of chalcogenide glass into pre-patterned trenches in a silica cladding. No processing of the chalcogenide glass is required. Four-wave mixing is demonstrated with nonlinear coefficient of
Autor:
E. Rabinovich, Alexander Axelevitch, M. Rattagi, A. Kozlovsky, Y. Rosenwaks, A. Seidman, P.J. Rancoita, Mark Oksman, Alexandra Inberg, N. Croitoru, Gady Golan
Publikováno v:
Microelectronics Journal. 31:937-944
The structure, microhardness and deformation character for silicon detectors were investigated following a neutron irradiation, using optical and Atomic Force (AFM) microscopes. The results of these investigations have given an important contribution
Autor:
Alexander Axelevitch, A. Seidman, M. Rattaggi, P. G. Rancoita, Yossi Rosenwaks, Gady Golan, Alexandra Inberg, A Kozlovsky, Mark Oksman, N. Croitoru, E. Rabinovich
Publikováno v:
Microelectronics Reliability. 39:1497-1504
The structure, microhardness and deformation character for silicon detectors were investigated following a neutron irradiation, using optical and atomic force (AFM) microscopes. The results of these investigations have given an important contribution
Publikováno v:
Journal of Clinical Laser Medicine & Surgery. 16:127-133
A novel type of flexible hollow waveguide that facilitates delivery of infrared radiation from source to treatment site, and made of polyimide tubes, was developed.Polyimide tubes with flat internal wall and optimal conditions of deposition of guidin
Publikováno v:
Diamond and Related Materials. 6:1152-1156
This paper presents results of the measurements of dark current and photocurrent, mobility, and decay time of photocurrent of doped and undoped a:DLC films as a function of temperature. The a:DLC films were grown by a r.f. glow discharge technique us
Publikováno v:
IEEE Journal of Selected Topics in Quantum Electronics. 2:880-889
Minimal invasive surgery (MIS) is the preferred method for performing medical operations today due to its lower cost, fast healing, and minimal post-operative pain and discomfort to the treated patients. It is rapidly expanding with the development a
Autor:
Roey Elnathan, Mark Oksman, Koteeswara Reddy, Nava Shpaisman, A. Tsukernik, Moshit Ben-Ishai, Alexander Pevzner, Yoni Engel, Tamir Ducobni, Fernando Patolsky
Publikováno v:
Nano letters. 10(4)
The large-scale assembly of nanowire elements with controlled and uniform orientation and density at spatially well-defined locations on solid substrates presents one of the most significant challenges facing their integration in real-world electroni
Autor:
Mark Oksman, Nathan I. Croitoru, Alexandra Inberg, Moshe Ben-David, Abraham Katzir, Israel Gannot, Ronald W. Waynant
Publikováno v:
SPIE Proceedings.
The study of output laser beam shape as a function of losses, internal diameter, off-center coupling and scattering is presented in this paper. The conditions where the beam shape has good correlation with the source beam shape were found (low losses