Zobrazeno 1 - 8
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pro vyhledávání: '"Mark J. McLean"'
Publikováno v:
Microscopy and Microanalysis. 27:176-177
Publikováno v:
Microsc Microanal
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::191081acbb0bb8a7f84d67c1a4073365
https://europepmc.org/articles/PMC7987226/
https://europepmc.org/articles/PMC7987226/
Publikováno v:
Analytical Chemistry
Atom probe tomography (APT)-based isotopic analyses are becoming increasingly attractive for analysis applications requiring small volumes of material and sub-micrometer length scales, such as isotope geochemistry, nuclear safety, and materials scien
Publikováno v:
Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada. 25(1)
Applying high-resolution electron backscatter diffraction (HR-EBSD) to materials without regions that are amenable to the acquisition of backgrounds for static flat fielding (background subtraction) can cause analysis problems. To address this diffic
Autor:
Frank W. DelRio, Mark J. McLean, Christopher Fred Keimel, Oliver Charles Boomhower, William A. Osborn, Rebecca Kirkpatrick
Publikováno v:
MRS Communications. 5:503-506
Micromechanical testing of electroplated gold alloy films has been conducted using theta-like specimens. Specimens were formed by a standard combination of photolithography, electroplating, and deep reactive ion etching. Testing was performed using a
Autor:
William A. Osborn, Mark J. McLean
Publikováno v:
Ultramicroscopy. 185
Compared to more commonly used strain measurement techniques, electron backscatter diffraction (EBSD) offers improved spatial resolution and measurement sensitivity. Additionally, EBSD can provide the full deformation tensor, whereas other techniques
Publikováno v:
Journal of Research of the National Institute of Standards and Technology
Laboratory notebooks have been a staple of scientific research for centuries for organizing and documenting ideas and experiments. Modern laboratories are increasingly reliant on electronic data collection and analysis, so it seems inevitable that th
Conference
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