Zobrazeno 1 - 10
of 40
pro vyhledávání: '"Mark Buckwell"'
Autor:
Jonas Pfaff, Matilda Fransson, Ludovic Broche, Mark Buckwell, Donal P. Finegan, Stefan Moser, Sebastian Schopferer, Siegfried Nau, Paul R. Shearing, Alexander Rack
Publikováno v:
Journal of Synchrotron Radiation, Vol 30, Iss 1, Pp 192-199 (2023)
The investigation of lithium-ion battery failures is a major challenge for personnel and equipment due to the associated hazards (thermal reaction, toxic gases and explosions). To perform such experiments safely, a battery abuse-test chamber has been
Externí odkaz:
https://doaj.org/article/518c945347c9478e86395a4d0e8ee27d
Autor:
Mark Buckwell, Wing H. Ng, Daniel J. Mannion, Horatio R. J. Cox, Stephen Hudziak, Adnan Mehonic, Anthony J. Kenyon
Publikováno v:
Frontiers in Nanotechnology, Vol 3 (2021)
Resistive random-access memories, also known as memristors, whose resistance can be modulated by the electrically driven formation and disruption of conductive filaments within an insulator, are promising candidates for neuromorphic applications due
Externí odkaz:
https://doaj.org/article/c1cdbdbe4c024d0bb9ea8fe7e774c965
Autor:
Horatio R. J. Cox, Mark Buckwell, Wing H. Ng, Daniel J. Mannion, Adnan Mehonic, Paul R. Shearing, Sarah Fearn, Anthony J. Kenyon
Publikováno v:
APL Materials, Vol 9, Iss 11, Pp 111109-111109-9 (2021)
The limited sensitivity of existing analysis techniques at the nanometer scale makes it challenging to systematically examine the complex interactions in redox-based resistive random access memory (ReRAM) devices. To test models of oxygen movement in
Externí odkaz:
https://doaj.org/article/6fb9ffa027bb410f95376d9d8dd875ab
Publikováno v:
Frontiers in Materials, Vol 6 (2019)
The atomic force microscope (AFM) empowers research into nanoscale structural and functional material properties. Recently, the scope of application has broadened with the arrival of conductance tomography, a technique for mapping current in three-di
Externí odkaz:
https://doaj.org/article/5facffdc2b57446580d1b2e28249a3f0
Publikováno v:
Frontiers in Neuroscience, Vol 13 (2019)
Resistive Random Access Memory (RRAM) is a promising technology for power efficient hardware in applications of artificial intelligence (AI) and machine learning (ML) implemented in non-von Neumann architectures. However, there is an unanswered quest
Externí odkaz:
https://doaj.org/article/47e3230268c34b75982f80d1958c76e4
Autor:
Konstantin Zarudnyi, Adnan Mehonic, Luca Montesi, Mark Buckwell, Stephen Hudziak, Anthony J. Kenyon
Publikováno v:
Frontiers in Neuroscience, Vol 12 (2018)
Resistance switching, or Resistive RAM (RRAM) devices show considerable potential for application in hardware spiking neural networks (neuro-inspired computing) by mimicking some of the behavior of biological synapses, and hence enabling non-von Neum
Externí odkaz:
https://doaj.org/article/c6dd4967e5e940adafe007aeac0999a3
Autor:
Mark Buckwell, Charlie Kirchner-Burles, Rhodri E. Owen, Tobias P. Neville, Julia S. Weaving, Daniel J.L. Brett, Paul R. Shearing
Publikováno v:
Journal of Energy Storage. 65:107069
Autor:
Anthony J Kenyon, Adnan Mehonic, Wing Ng, Longfei Zhao, Horatio Cox, Mark Buckwell, Kamal Patel, Andrew P Knights, Daniel J Mannion, Alexander L Shluger
Publikováno v:
2022 11th International Conference on Modern Circuits and Systems Technologies (MOCAST).
Autor:
Jonas Pfaff, Matilda Fransson, Ludovic Broche, Mark Buckwell, Donal P. Finegan, Stefan Moser, Sebastian Schopferer, Siegfried Nau, Paul R. Shearing, Alexander Rack
Publikováno v:
Journal of synchrotron radiation. 30(Pt 1)
The investigation of lithium-ion battery failures is a major challenge for personnel and equipment due to the associated hazards (thermal reaction, toxic gases and explosions). To perform such experiments safely, a battery abuse-test chamber has been
Autor:
Martin Pham, Dan J. L. Brett, Anand N. P. Radhakrishnan, Gareth Hinds, Alexander Rack, Paul R. Shearing, Donal P. Finegan, Mark Buckwell
Abuse testing of lithium-ion batteries is widely performed in order to develop new safety standards and strategies. However, testing methodologies are not standardised across the research community, especially with failure mechanisms being inherently
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::748216c504d8d1e79d84dd8d02ba4ce1
https://doi.org/10.26434/chemrxiv-2021-jpp7l
https://doi.org/10.26434/chemrxiv-2021-jpp7l