Zobrazeno 1 - 10
of 151
pro vyhledávání: '"Mark B Ketchen"'
Publikováno v:
IEEE Transactions on Applied Superconductivity. 29:1-11
Energy-efficient rapid single flux quantum circuits having zero static power dissipation require a feeding Josephson junction transmission line (FJTL) to stabilize the power bus voltage. It is shown how a FJTL can be configured to obtain a desired cu
Publikováno v:
IEEE Transactions on Applied Superconductivity. 29:1-7
A test structure suite to measure circuit delays, power, and operating margins of single flux quantum (SFQ) circuits and to derive key parameters directly from dc testable high-speed circuits is described. This suite comprises a set of ring oscillato
Autor:
Manjul Bhushan, Mark B. Ketchen
CMOS Test and Evaluation: A Physical Perspective is a single source for an integrated view of test and data analysis methodology for CMOS products, covering circuit sensitivities to MOSFET characteristics, impact of silicon technology process variabi
Publikováno v:
Nature Physics. 6:260-264
The recent discovery of iron-based superconductors challenges the existing paradigm of high-temperature superconductivity. Owing to their unusual multi-orbital band structure, magnetism, and electron correlation, theories propose a unique sign revers
Autor:
Mark B. Ketchen, David J. Frank, Brian L. Ji, Dale Jonathan Pearson, I. Lauer, F. Stellari, Leland Chang
Publikováno v:
IEEE Transactions on Semiconductor Manufacturing. 22:51-58
A new test structure has been developed, which is comprised of MOSFET arrays and an on-chip operational amplifier feedback loop for measuring threshold voltage variation. The test structure also includes an on-chip clock generator and address decoder
Publikováno v:
IEEE Transactions on Semiconductor Manufacturing. 21:180-185
A technique for extracting small signal MOSFET gate capacitance as a function of bias voltage from measurements of circuit delay and power is described. This approach makes use of a ring oscillator with stages in which an independent bias voltage is
Autor:
Mark B. Ketchen, Manjul Bhushan
Publikováno v:
CMOS Test and Evaluation
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e8416c88268f8dfa51b7875a0972e122
https://doi.org/10.1007/978-1-4939-1349-7
https://doi.org/10.1007/978-1-4939-1349-7
Autor:
Mark B. Ketchen, M. Bhushan
Publikováno v:
IBM Journal of Research and Development. 50:451-468
The design of product-representative test structures for measuring and characterizing CMOS circuit performance, power, and variability at speeds characteristic of present-day microprocessors is described. The current use of this set of test structure
Publikováno v:
IEEE Transactions on Semiconductor Manufacturing. 19:10-18
Test structures utilizing ring oscillators to monitor MOSFET ac characteristics for digital CMOS circuit applications are described. The measurements provide information on the average behavior of sets of a few hundred MOSFETs under high speed switch
Publikováno v:
Physica C: Superconductivity. :1539-1545
This paper recounts the development of a superconducting bandpass delta-sigma (ΔΣ) modulator for direct analog-to-digital conversion of radio frequency signals in the GHz range. The modulator design benefits from several advantages of superconducti