Zobrazeno 1 - 10
of 26
pro vyhledávání: '"Mark A. Schulze"'
Publikováno v:
The Condor. 102:113-126
We studied Double-toothed Kites (Harpagus bidentatus) in tropical lowland forest at Tikal National Park, Petén, Guatemala, documenting behavior and diet during the incubation and nestling periods. These 200-g kites are Accipiter-like in form and str
Autor:
Kenneth R. Castleman, Roland Eils, Michael R. Speiche, Jim Piper, Kaan Saracoglu, Larry E. Morrison, Mark A. Schulze
Publikováno v:
Cytometry. 41:139-147
Background The discriminatory power and imaging efficiency of different multicolor FISH (M-FISH) analysis systems are key factors in obtaining accurate and reproducible classification results. In a recent paper, Garini et al. put forth an analytical
Autor:
John K. Grant, Cecy A. Pelz, Chi Ying-liang, Cliff Schmucker, Mark A. Schulze, Thomas Myers, Noah Brickman, Michael G. Durrett
Publikováno v:
21st AIAA Aerodynamic Decelerator Systems Technology Conference and Seminar.
Autor:
James W. McGinity, Mark D. Schulze
Publikováno v:
Drug Development and Industrial Pharmacy. 19:1393-1411
The indices of tableting performance were used to investigate the compaction properties of two methacrylate ester copolymers (Eudragit® RS PM and RL PM) and three methacrylic acid copolymers (Eudragit® S 100, L 100, and L 100–55). These polymers
Publikováno v:
Drug Development and Industrial Pharmacy. 16:741-754
Tensile strengths of compacts consisting of acrylic resin polymers in combination with a plastic drug (theophylline) and a brittle drug (sodium sulfathiazole) were investigated. The polymers studied included Eudragit RS PM, RL PM, S 100, L 100, and L
Autor:
Mark A. Cochrane, Mark D. Schulze
Publikováno v:
Conservation Biology. 12:948-950
Autor:
Mark A. Schulze, Randall G. Smith, Edgar Voelkl, Martin A. Hunt, C. E. Thomas, William R. Usry, Robert Bryant, Joel D. Hickson
Publikováno v:
Process and Materials Characterization and Diagnostics in IC Manufacturing.
Defect inspection metrology is an integral part of the yield ramp and process monitoring phases of semiconductor manufacturing. High aspect ratio structures have been identified in the ITRS as critical structures where there are no known manufacturab
Autor:
Robert W. Owen, Karsten S. Weber, Xiaolong Dai, William R. Usry, James S. Goddard, Tracy M. Bahm, Christopher Marek, Allen N. Su, George C. John, Judd M. Gilbert, Michael W. Mayo, Matthew D. Chidley, Michael L. Jones, Martin A. Hunt, Mark A. Schulze, C. E. Thomas, J.H. Price, Randall G. Smith, Edgar Voelkl, Bichuan Shen, David A Rasmussen, Joel D. Hickson, Ayman M. El-Khashab, Kenneth W. Tobin, Louis J. Schaefer, Philip R. Bingham, Gregory R. Hanson, Larry R. Baylor, Robert J. Delahanty, Kathy W. Hylton
Publikováno v:
AIP Conference Proceedings.
Direct to Digital Holography (DDH) has been developed as a semiconductor wafer inspection tool and in particular as a tool for seeing defects in high aspect ratio (HAR) structures on semiconductor wafers and also for seeing partial‐height defects.
Autor:
Mark A. Schulze, John A. Pearce
Publikováno v:
ICIP (2)
We introduce the value-and-criterion filter structure, a new framework for designing filters based on mathematical morphology. The value-and-criterion filter structure is more flexible than the morphological structure, because it allows linear and no
Publikováno v:
ISCAS '98. Proceedings of the 1998 IEEE International Symposium on Circuits and Systems (Cat. No.98CH36187).
The steerable pyramid decomposition is an invertible representation similar to the two-dimensional discrete wavelet transform, but with interesting shift- and rotation-invariance properties. It is slightly overcomplete and amenable to a filter bank i