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pro vyhledávání: '"Mark A. Lysinger"'
Publikováno v:
IOLTS
This paper reviews recent experimental confirmations that the intrinsic radiation robustness of commercial CMOS technologies naturally improves with the down-scaling. When additionally using innovative design techniques, it becomes now possible to as
Autor:
D. McClure, Philippe Roche, Mehdi Zamanian, N. Sahoo, J. Russell, F. Jacquet, Mark A. Lysinger
Publikováno v:
ISQED
An eight megabit rad hard SRAM, implemented in 130 nm CMOS technology, uses stacked capacitors within the memory cell for robustness, supply power gating and internally developed array power supplies to achieve very low soft error rates and standby c