Zobrazeno 1 - 10
of 76
pro vyhledávání: '"Marjorie A, Olmstead"'
Autor:
Fumio S. Ohuchi, Benjamin W. Krueger, Evan M. Nelson, Christopher S. Dandeneau, Scott T. Dunham, Marjorie A. Olmstead
Publikováno v:
Journal of the American Ceramic Society. 99:2467-2473
Single-phase monoclinic aluminum–gallium oxide powders, β−(AlxGa1−x)2O3, have been produced by solution combustion synthesis for Al fraction 0 ≤ x
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e0f38487fd4181d8821a7faf18c2f3f5
https://doi.org/10.1111/jace.14222
https://doi.org/10.1111/jace.14222
Autor:
Marjorie A. Olmstead, Fumio S. Ohuchi, Patrick J. Shamberger, Kenneth M. Beck, Alan G. Joly, Chill-Yuan Lu, Esmeralda N. Yitamben
Publikováno v:
Applied Physics A. 93:93-98
Phase transformation of thin film (∼30 nm)In2Se3/Si(111) (amorphous→crystalline) was performed by resistive annealing and the reverse transformation (crystalline→amorphous) was performed by nanosecond laser annealing. As an intrinsic-vacancy, b
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::2ca1f44fb8962648908e965ca82fc53e
https://doi.org/10.1007/s00339-008-4776-8
https://doi.org/10.1007/s00339-008-4776-8
Publikováno v:
Physical Review B. 61:7215-7218
Deposition of Se and GaSe on $\mathrm{Si}(111)7\ifmmode\times\else\texttimes\fi{}7$ surfaces was studied with low-energy electron diffraction, x-ray photoelectron spectroscopy, and x-ray photoelectron diffraction to probe initial nucleation and inter
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f8ddb6a118cf51b8fa3b90a1a779a861
https://doi.org/10.1103/physrevb.61.7215
https://doi.org/10.1103/physrevb.61.7215
Publikováno v:
Scopus-Elsevier
We have studied diffusion of Ge into subsurface layers of Si(100). Auger electron diffraction measurements show Ge in the fourth layer after submonolayer growth at temperatures as low as 500 degrees C. Density functional theory predictions of equilib
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::b5c8fe41e2bd46276d8e3a8c913a0060
https://doi.org/10.1103/physrevlett.84.2441
https://doi.org/10.1103/physrevlett.84.2441
Publikováno v:
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films. 16:2376-2380
We have investigated the growth of GaSe, a layered semiconductor, on single crystal Al2O3(0001)(sapphire), an ionic crystal. We have used reflection high energy electron diffraction, x-ray photoelectron spectroscopy, and transmission electron microsc
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1b4680f26d9c7400da289fb8a4821b68
https://doi.org/10.1116/1.581355
https://doi.org/10.1116/1.581355
Publikováno v:
Physical Review B. 53:1584-1593
Bulk and interface photoemission satellite excitations, measured with x-ray photoelectron spectroscopy and x-ray photoelectron diffraction, are compared for thick, thin, and monolayer films of ${\mathrm{CaF}}_{2}$ and ${\mathrm{SrF}}_{2}$ on Si(111).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::8fd8d6b3748361d01a4911ecb34a0eb5
https://doi.org/10.1103/physrevb.53.1584
https://doi.org/10.1103/physrevb.53.1584
Publikováno v:
Physical Review Letters. 75:2380-2383
The thickness uniformity and the spatial distribution of lattice relaxation in thin ( $l$8 nm) Ca${\mathrm{F}}_{2}$/Si(111) films, observed with photoelectron spectroscopy and transmission electron microscopy, are seen to depend strongly on the initi
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::41d08a77e42cf2c3e3742acaeac10117
https://doi.org/10.1103/physrevlett.75.2380
https://doi.org/10.1103/physrevlett.75.2380
Publikováno v:
Physical Review B. 51:5352-5365
Kinetic variations of the initial stages of CaF[sub 2] growth on Si(111) by molecular-beam epitaxy are studied with the [ital in] [ital situ] combination of x-ray photoelectron spectroscopy and diffraction. After the formation of a chemically reacted
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::2d9d6fc33e9b057ecac42691cb763f90
https://doi.org/10.1103/physrevb.51.5352
https://doi.org/10.1103/physrevb.51.5352
Publikováno v:
Physical Review B. 50:11052-11069
Using x-ray-photoelectron spectroscopy and Auger-electron spectroscopy, we have resolved surface, bulk, and interface Ca and F core-level emission in thin films (3--8 triple layers) of CaF[sub 2] and SrF[sub 2] on Si(111). We confirmed these assignme
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::b48062555f109787742a53bb8755e0c5
https://doi.org/10.1103/physrevb.50.11052
https://doi.org/10.1103/physrevb.50.11052
Publikováno v:
Physical Review B. 83
The growth and phase segregation properties of the potential dilute magnetic semiconductor alloy (MnSe)${}_{x}$(Ga${}_{2/3}$Se)${}_{1\ensuremath{-}x}$ are studied as a function of thickness, Mn concentration, postgrowth annealing, and the presence or
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::7b3972d20886fc84fe1af74b6edd8415
https://doi.org/10.1103/physrevb.83.155312
https://doi.org/10.1103/physrevb.83.155312