Energy-Harvesting Powered Variable Storage Topology For Battery-Free Wireless Sensors

Autor: F. El Mahboubi, Marise Bafleur, V. Boitier, J-M. Dilhac

Publikováno v: International Conference on Modern Circuits and Systems Technologies (MOCAST) on Electronics and Commuications
International Conference on Modern Circuits and Systems Technologies (MOCAST) on Electronics and Commuications, May 2018, Thessaloniki, Greece. ⟨10.1109/MOCAST.2018.8376624⟩
MOCAST
Technologies
Technologies, MDPI, 2018, 6 (4), pp.106
Technologies, Vol 6, Iss 4, p 106 (2018)
Volume 6
Issue 4
Technologies, 2018, 6 (4), pp.106

International audience; The energy autonomy of wireless sensors is one of the main roadblocks to their wide deployment. The purpose of this study is to propose simple adaptive storage architecture, which combined with energy harvesting, could replace

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::ebc8f8bb6cff5aee070bca567b89fde5
https://hal.laas.fr/hal-01747946

Single piezoelectric transducer as strain sensor and energy harvester using time-multiplexing operation

Autor: Meiling Zhu, Marise Bafleur, Jean-Marie Dilhac, Tingwen Ruan, Zheng Jun Chew

Publikováno v: IEEE Transactions on Industrial Electronics
IEEE Transactions on Industrial Electronics, 2017, 64 (12), pp.9646-9656. ⟨10.1109/TIE.2017.2711562⟩
IEEE Transactions on Industrial Electronics, Institute of Electrical and Electronics Engineers, 2017, 64 (12), pp.9646-9656. ⟨10.1109/TIE.2017.2711562⟩

International audience; This paper presents the implementation of a single piece of macro-fiber composite (MFC) piezoelectric transducer as a multifunctional device for both strain sensing and energy harvesting for the first time in the context of an

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::2ba505944fde5ac7d905cea9f3f76530
https://hal.science/hal-01677652/document

ESD Protection Methodologies : From Component to System

Autor: Marise Bafleur, Fabrice Caignet, Nicolas Nolhier

Failures caused by electrostatic discharges (ESD) constitute a major problem concerning the reliability and robustness of integrated circuits and electronic systems. This book summarizes the many diverse methodologies aimed at ESD protection and show

Prediction of LIN communication robustness against EFT events using dedicated failure models

Autor: Fabrice Caignet, Nicolas Nolhier, Frédéric Escudié, Marise Bafleur

Publikováno v: Microelectronics Reliability
Microelectronics Reliability, Elsevier, 2017, 76-77, pp.685-691. ⟨10.1016/j.microrel.2017.07.032⟩
Microelectronics Reliability, 2017, 76-77, pp.685-691. ⟨10.1016/j.microrel.2017.07.032⟩

International audience; During its life, an automotive application can encounter several perturbations such as fast transient of ESD discharges. In this paper, we propose a LIN transceiver behavior model to predict both hard and soft failures within

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::89c0c3535644debd036d1095683774bc
https://hal.laas.fr/hal-01698397/document

New triggering-speed-characterization method for diode-triggered SCR using TLP

Autor: Mouna Mahane, Marianne Diatta, Benjamin Thon, Lionel Jaouen, David Trémouilles, Marise Bafleur

Publikováno v: Microelectronics Reliability
Microelectronics Reliability, Elsevier, 2017, 76-77, pp.692-697. ⟨10.1016/j.microrel.2017.07.063⟩
Microelectronics Reliability, 2017, 76-77, pp.692-697. ⟨10.1016/j.microrel.2017.07.063⟩

International audience; The key parameters in the optimization of the Diode Triggered Silicon-Controlled Rectifier (DTSCR) as a RF ESD protection, are the turn-on time and the trigger-voltage overshoots seen before the SCR turns on, during very fast

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::3432ccc8ee67a9b9b01a084afb209230
https://hal.laas.fr/hal-01643028/document