Simultaneous Characterization of In-Plane and Cross-Plane Resistivities in Highly Anisotropic 2D Layered Heterostructures.

Autor: Weng S; Ming Hsieh Department of Electrical Engineering, University of Southern California, Los Angeles, California 90089, United States., Wang Y; Mork Family Department of Chemical Engineering and Materials Science, University of Southern California, Los Angeles, California 90089, United States.; Department of Mechanical Engineering, Stanford University, Stanford, California 94305, United States., Price C; Department of Chemistry, University of Oregon, Eugene, Oregon 97403, United States., Blackwood HR; Department of Chemistry, University of Oregon, Eugene, Oregon 97403, United States., Choffel M; Department of Chemistry, University of Oregon, Eugene, Oregon 97403, United States., Miller A; Department of Chemistry, University of Oregon, Eugene, Oregon 97403, United States., Li R; Mork Family Department of Chemical Engineering and Materials Science, University of Southern California, Los Angeles, California 90089, United States., Chen M; Mork Family Department of Chemical Engineering and Materials Science, University of Southern California, Los Angeles, California 90089, United States., Lu P; Sandia National Laboratories, Albuquerque, New Mexico 87185, United States., Ilkhani S; Department of Chemistry, University of Southern California, Los Angeles, California 90089, United States., Majumdar A; Department of Mechanical Engineering, Stanford University, Stanford, California 94305, United States., Johnson DC; Department of Chemistry, University of Oregon, Eugene, Oregon 97403, United States., Cronin SB; Ming Hsieh Department of Electrical Engineering, University of Southern California, Los Angeles, California 90089, United States.; Department of Chemistry, University of Southern California, Los Angeles, California 90089, United States.; Department of Physics and Astronomy, University of Southern California, Los Angeles, California 90089, United States.

Publikováno v: ACS nano [ACS Nano] 2024 Sep 17; Vol. 18 (37), pp. 25405-25413. Date of Electronic Publication: 2024 Sep 02.